Demo Data from VLDB 2026 / reviewers in the wild / expert
Hsing-San Lee
dblp:32/21
· DBLP profile ↗
1ranked-venue papers
0as first author
0since 2021 · last 1992
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Distributed systems · 53% Integrated circuit design · 32% Hardware reliability and fault tolerance · 16% |
Topics — the 4 heaviest of 4, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Distributed systems
fault tolerance |
0.0 | 1 | 1992 | Synergistic Fault-Tolerance for Memory Chips · IEEE Trans. Computers 1992 |
Hardware reliability and fault tolerance › error correction
error-correcting codes |
0.0 | 1 | 1992 | Synergistic Fault-Tolerance for Memory Chips · IEEE Trans. Computers 1992 |
Integrated circuit design › semiconductor devices
memory devices |
0.0 | 1 | 1992 | Synergistic Fault-Tolerance for Memory Chips · IEEE Trans. Computers 1992 |
Integrated circuit design
VLSI design |
0.0 | 1 | 1992 | Synergistic Fault-Tolerance for Memory Chips · IEEE Trans. Computers 1992 |
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1992 | Synergistic Fault-Tolerance for Memory ChipsabstractThe discovery of a principle of synergistic fault tolerance is described, and it is shown analytically why it occurs. The performance of its hardware implementation, in the form of a VLSI memory chip, is reported. An analysis of the error-correction scheme implemented in the hardware is presented, and limitations to the use of error-correcting codes for fault tolerance are explained. Methods for circumventing these limitations with the use of redundant circuits are discussed, analyzing the effect of bitline and wordline redundancy. The result of the analysis shows how the combination of error-correcting codes with redundant circuitry results in a fault-tolerance synergism.> Charles H. Stapper, Hsing-San Lee |
IEEE Trans. Computers | 2 |