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Marco A. Peña

dblp:32/2546 · DBLP profile ↗
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5ranked-venue papers
1as first author
0since 2021 · last 2005
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 4 · 1 first-authorSoftware engineering, systems software and programming languages · 3 · 1 first-authorTheory of computation · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
2 papers
Electronic design automation · 100%
Theoretical computer science
2 papers
Automated reasoning and model checking · 75% Automata and formal languages · 25%

Topics — the 8 heaviest of 9, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation › hardware verification and test
asynchronous circuit testing
0.011997
Automatic Generation of Synchronous Test Patterns for Asynchronous Circuits · DAC 1997
Electronic design automation
hardware verification and test
0.011997
Automatic Generation of Synchronous Test Patterns for Asynchronous Circuits · DAC 1997
Electronic design automation
logic synthesis
0.011997
Synthesis of Speed-Independent Circuits from STG-Unfolding Segment · DAC 1997
Electronic design automation › logic synthesis › asynchronous circuit synthesis
speed-independent circuit synthesis
0.011997
Synthesis of Speed-Independent Circuits from STG-Unfolding Segment · DAC 1997
Electronic design automation › hardware verification and test
test generation
0.011997
Automatic Generation of Synchronous Test Patterns for Asynchronous Circuits · DAC 1997
Automata and formal languages › petri nets
signal transition graph
0.011997
Synthesis of Speed-Independent Circuits from STG-Unfolding Segment · DAC 1997
Electronic design automation › hardware verification and test
fault modeling
0.011997
Automatic Generation of Synchronous Test Patterns for Asynchronous Circuits · DAC 1997
Electronic design automation › hardware verification and test › fault modeling
stuck-at fault
0.011997
Automatic Generation of Synchronous Test Patterns for Asynchronous Circuits · DAC 1997

Methods — techniques the papers use, named apart from their topics

partial order representation · 0.0approximation · 0.0synchronous finite state machine abstraction · 0.0
YearPublicationVenuePosition
2005 TRANSYT: A Tool for the Verification of Asynchronous Concurrent Systems
Enric Pastor, Marco A. Peña, Marc Solé
CAV2
2003 Combining Simulation and Guided Traversal for the Verification of Concurrent Systems
Enric Pastor, Marco A. Peña
DATE2
2002 A Case Study for the Verification of Complex Timed Circuits: IPCMOS
abstract
The verification of a n-stage pulse-driven IPCMOS pipeline, for any n>0, is presented. The complexity of the system is 32n transistors and delay information is provided at the level of transistor The correctness of the circuit highly depends on the timed behavior of its components and the environment. To verify the system, three techniques have been combined: (1) relative-timing-based verification from absolute timing information, (2) assume-guarantee reasoning to verify untimed abstractions of timed components and (3) mathematical induction to verify pipelines of any length. Even though the circuit can interact with pulse-driven environments, the internal behavior between stages commits a handshake protocol that enables the use of untimed abstractions. The verification not only reports a positive answer about the correctness of the system, but also gives a set of sufficient relative-timing constraints that determine delay slacks under which correctness can be maintained.
Marco A. Peña, Jordi Cortadella, Alexander B. Smirnov, Enric Pastor
DATE1
1997 Automatic Generation of Synchronous Test Patterns for Asynchronous Circuits
abstract
This paper presents a novel approach for automatic test patterngeneration of asynchronous circuits. The techniques used for thispurpose assume that the circuit can only be exercised by applyingsynchronous test vectors, as is done by real-life testers.The main contribution of the paper is the abstraction of thecircuit's behavior as a synchronous finite state machine in such away that similar techniques to those currently used for synchronouscircuits can be safely applied for testing.Currently, the fault model being used is the input stuck-at model.Experimental results on different benchmarks show that our approachgenerates test vectors with high fault coverage.
Oriol Roig, Jordi Cortadella, Marco A. Peña, Enric Pastor
DAC3
1997 Synthesis of Speed-Independent Circuits from STG-Unfolding Segment
abstract
This paper presents a novel technique for synthesis of speed-independentcircuits. It is based on partial order representation ofthe state graph called STG-unfolding segment. The new methoduses approximation technique to speed up the synthesis process.The method is illustrated on the basic implementation architecture.Experimental results demonstrating its efficiency are presented anddiscussed.
Alexei L. Semenov, Alexandre Yakovlev, Enric Pastor, Marco A. Peña, Jordi Cortadella
DAC4