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John D. Shott

dblp:327/2217 · DBLP profile ↗
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1ranked-venue papers
0as first author
0since 2021 · last 1986
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Applied, interdisciplinary, general and emerging computing · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Embedded and real-time systems · 62% Integrated circuit design · 38%

Topics — the 3 heaviest of 3, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Embedded and real-time systems › cyber-physical system platforms › industrial automation
semiconductor manufacturing automation
0.011986
The future of automation for high-volume Wafer fabrication and ASIC manufacturing · Proc. IEEE 1986
Integrated circuit design
ASIC design
0.011986
The future of automation for high-volume Wafer fabrication and ASIC manufacturing · Proc. IEEE 1986
Integrated circuit design › ASIC design
gate array
0.011986
The future of automation for high-volume Wafer fabrication and ASIC manufacturing · Proc. IEEE 1986

Methods — techniques the papers use, named apart from their topics

yield management · 0.0contamination control · 0.0
YearPublicationVenuePosition
1986 The future of automation for high-volume Wafer fabrication and ASIC manufacturing
abstract
Faced with increasing technical and commercial challenges from the Far East, many U.S. semiconductor manufacturers have been directing their efforts toward the Application-Specific Integrated Circuit (ASIC) or custom integrated circuit marketplace. This market is flourishing because advances in technologies such as gate arrays and standard cells now make it significantly easier to obtain system cost and performance advantages by integrating nonstandard functions on silicon. They are attractive to U.S. manufacturers because they place a premium on sophisticated design tools, familiarity with customer needs and applications, and fast turn-around fabrication. These are areas where U.S. manufacturers believe they have an advantage and, consequently, they believe they will not suffer from the severe price/manufacturing competition encountered in conventional high-volume semiconductor products. In the past, automation was often considered viable only for high-volume manufacturing, but automation becomes a necessity in the new ASIC environment. ASIC requirements for increased product variability, strict delivery schedules, and the need to guarantee acceptable yields at the individual wafer level (as opposed to yields averaged over large lots) are the areas which automation must address. These challenges, combined with the need for more efficient and contamination-free production environments, are certain to stress the resources of even the most competent companies. This paper explores some challenges which must be met before automated custom device manufacturing can be successful and outlines the role automation will play in helping to meet these challenges.
Randall A. Hughes, John D. Shott
Proc. IEEE2