Demo Data from VLDB 2026 / reviewers in the wild / expert
Abbey Vincent
dblp:329/3727
· DBLP profile ↗
1ranked-venue papers
0as first author
1since 2021 · last 2022
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Software engineering, systems software and programming languages · 1 · 1 since 2021
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Software engineering, system software, and programming languages
1 paper |
Debugging and program repair · 81% Software testing · 19% |
Topics — the 3 heaviest of 3, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Debugging and program repair › software debugging
software failure analysis |
0.6 | 1 | 2022 | Reflections on software failure analysis · ESEC/SIGSOFT FSE 2022 |
Software testing
fault detection |
0.2 | 1 | 2022 | Reflections on software failure analysis · ESEC/SIGSOFT FSE 2022 |
Debugging and program repair
program repair |
0.2 | 1 | 2022 | Reflections on software failure analysis · ESEC/SIGSOFT FSE 2022 |
Methods — techniques the papers use, named apart from their topics
failure study · 0.6
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2022 | Reflections on software failure analysisabstractFailure studies are important in revealing the root causes, behaviors, and life cycle of defects in software systems. These studies either focus on understanding the characteristics of defects in specific classes of systems, or the characteristics of a specific type of defect in the systems it manifests in. Failure studies have influenced various software engineering research directions, especially in the area of software evolution, defect detection, and program repair. Paschal C. Amusuo, Aishwarya Sharma, Siddharth R. Rao, Abbey Vincent, James C. Davis 0001 |
ESEC/SIGSOFT FSE | 4 |