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H. M. Chen

dblp:33/1628 · DBLP profile ↗
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4ranked-venue papers
1as first author
0since 2021 · last 2009
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 2 · 1 first-authorArtificial intelligence and machine learning · 1Databases, data management, data science and information retrieval · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Electronic design automation · 67% Performance modeling and evaluation · 33%

Topics — the 3 heaviest of 3, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation
design optimization
0.012000
Global optimization for digital MOS circuits performance · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2000
Performance modeling and evaluation › numerical algorithms
global optimization
0.012000
Global optimization for digital MOS circuits performance · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2000
Electronic design automation › design for manufacturability › design for yield
parametric yield optimization
0.012000
Global optimization for digital MOS circuits performance · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2000

Methods — techniques the papers use, named apart from their topics

global approximation · 0.0genetic algorithm · 0.0
YearPublicationVenuePosition
2009 Improving scheduling of emergency physicians using data mining analysis
C. C. Yang, W. T. Lin, H. M. Chen, Y. H. Shi
Expert Syst. Appl.3
2006 E-Government Strategies in Developed and Developing Countries: An Implementation Framework and Case Study
abstract
Given the fact that more and more governments invest heavily in e-government design and implementation, e-government has become an evolving and important research area in the IS field. Most, if not all, currently published e-government strategies are based on successful experiences from developed countries, which may not be directly applicable to developing countries. Based on a literature review, this study summarizes differences between developed/developing countries. It identifies key factors for a successful e-government implementation and proposes an implementation framework. As a demonstration, we follow the guidance of the proposed framework in conducting a case study to analyze the implementation strategies of e-government in developed and developing countries.
H. M. Chen, Wayne Huang 0001, Russell K. H. Ching
J. Glob. Inf. Manag.2
2000 Global optimization for digital MOS circuits performance
abstract
Apart from maximization of parametric yield, minimization of the spread in performance functions due to process variation is of extreme importance in very large scale integrated circuit design. To achieve efficient minimization of the spread, a novel algorithm based on the genetic algorithm and global approximation methods is proposed. The algorithm operates in two stages designated as coarse and fine optimization stages and adjusts design parameter set to simultaneously achieve the target performance and reduction in performance spread. The algorithm has distinctive features, such as global optimum design, subexponential complexity algorithm for N-P complete problem of global optimization, and simultaneous optimization of many functions. The algorithm is demonstrated using four design examples.
H. M. Chen, G. S. Samudra, D. S. H. Chan, Yaacob Ibrahim
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.1
1999 Yield Optimization by Design Centering and Worst-Case Distance Analysis
abstract
Process variations invariably give rise to a parametric yield below 100% for VLSI circuits. Improving the yield by choosing a set of optimum parameter values does not incur any extra cost, and it is a preferred method as it directly translates into profits. The paper presents an efficient and novel method to improve the VLSI parametric yield by selecting optimum parameter values. This method utilizes the worst-case distance analysis, design centering and gradient-dependent techniques. One circuit example is presented to demonstrate the optimization scheme.
G. S. Samudra, H. M. Chen, D. S. H. Chan, Yaacob Ibrahim
ICCD2