An attempt is made to demonstrate that the problem of complete test set generation is amenable to the problem of pseudo-Boolean programming. For this purpose, various types of faults, viz., single faults, multiple faults, and bridging faults, are considered. The key issue is to obtain logical expressions for the primary output line in terms of different faulty internal nodes to find real transforms. Using standard rules, the real transforms of a Boolean function can be obtained directly without any algebraic manipulation.>

This technical letter reports the development of a novel design for a sequential network in order to facilitate the single stuck-at fault detection problem. This has been achieved by the use of AND, OR, and NOT logic gates and by inserting additional observed outputs.