Control channels on microfluidic large-scale integration (mLSI) chips are prone to blockage and leakage defects. In this work, we propose a built-in self-test (BIST) method that drastically improves the test efficiency. Given n to-be-tested control channels, we reduced the number of test patterns for blockage and leakage tests from [EQUATION] to 1, and from ⌈log2(n + 1)⌉ to ⌈log2(χ(G) + 1)⌉, respectively, where χ(G) denotes the vertex chromatic number of a graph G consisting of n vertices. We fabricated our design and demonstrated the feasibility and efficiency of our method.

After decades of development, flow-based microfluidic biochips have become an increasingly attractive platform for biochemical experiments. The fluid transportation and the on-chip device operation are controlled by microvalves, which are driven by external pneumatic controllers. To meet the increasingly complex experimental demands, the number of microvalves has significantly increased, making it necessary to adopt multiplexers (MUXes) for the actuation of microvalves. However, existing MUX designs have limited coding capacities, resulting in area overhead and excessive chip-to-world interface. This paper proposes a novel gate structure for modifying the current MUX architecture, along with a mixed coding strategy that achieves the maximum coding capacity within the modified MUX architecture. Additionally, an efficient synthesis tool for the mixed-coding-based MUXes (LaMUXes) is presented. Experimental results demonstrate that the LaMUX is exceptionally efficient, substantially reducing the usage of pneumatic controllers and microvalves compared to existing MUX designs.

Microfluidic large-scale integration (mLSI) is a promising lab-on-a-chip platform for high-throughput bio-applications. Due to the high integration scale and the small feature size, control channels on mLSI chips are prone to blockage and leakage defects, which may lead to faulty behavior of valves and erroneous experimental results. Thus, mLSI chips need to be tested before usage. Current mLSI-tests are mostly performed in a straightforward way by testing each valve individually, which is very time consuming and error prone. As the integration scale of mLSI chips keeps increasing, there is a pressing demand for more efficient test approaches. This work proposes the first built-in-self-test (BIST) method for mLSI with an integrated test module design. Instead of testing individual valves, the proposed method directly tests the control channels and thus greatly improves the test efficiency. Only${}({n}/{2})$and$\lceil \log _{2}(n+1)\rceil $test operations are required to test the blockage and leakage defects, respectively, of$n$control channels. The proposed test module consumes moderate area overhead and the test method is easy to operate. Neither specialized software nor external pressure sensors are required for carrying out the tests. Experiments show that our test approach is sensitive enough to detect defects that have a feature size as small as 10$\mu \text{m}$and that are several centimeters away from the test module.