Wei Wang 0087

dblp:35/7092-87 · DBLP profile ↗
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4ranked-venue papers
1as first author
2since 2021 · last 2023
0000-0002-5257-7675ORCID · conflict

Domains — the database's venue-derived domains; a paper can count in several

Software engineering, systems software and programming languages · 2 · 2 since 2021Applied, interdisciplinary, general and emerging computing · 2 · 1 first-author
YearPublicationVenuePosition
2023 FVA: Assessing Function-Level Vulnerability by Integrating Flow-Sensitive Structure and Code Statement Semantic
abstract
Previous studies have been conducted on software vulnerability (SV) assessment at the code-based level, especially the function level. However, a key limitation of these studies is that they do not consider the structure information (e.g., control dependency and data dependency) of a vulnerable function, which is crucial for understanding SVs and assigning priority for fixing. In this study, we propose a flow-sensitive, multitask, and function-level vulnerability assessment method named FVA, which considers both global structure information and local semantic information. More specifically, FVA considers two types of flow information extracted from the control dependence graph and the data dependence graph. Meanwhile, FVA also considers the deep semantic information of the statement as well as its various types of contexts (i.e., surrounding context and program slicing context). We evaluate the effectiveness of FVA on the large-scale dataset (4,467 functions) by comparing it with four state-of-the-art baselines in terms of five performance measures. The experimental results indicate that FVA outperforms these baselines by a significant margin. More precisely, on average, FVA obtains 0.795 of F1-score and 0.727 of MCC, which improves baselines by 5%-14% and 8%-20%, respectively.
Chao Ni 0001, Liyu Shen, Wei Wang 0087, Xiang Chen 0005, Lexiao Zhang
ICPC3
2022 The best of both worlds: integrating semantic features with expert features for defect prediction and localization
abstract
To improve software quality, just-in-time defect prediction (JIT-DP) (identifying defect-inducing commits) and just-in-time defect localization (JIT-DL) (identifying defect-inducing code lines in commits) have been widely studied by learning semantic features or expert features respectively, and indeed achieved promising performance. Semantic features and expert features describe code change commits from different aspects, however, the best of the two features have not been fully explored together to boost the just-in-time defect prediction and localization in the literature yet. Additional, JIT-DP identifies defects at the coarse commit level, while as the consequent task of JIT-DP, JIT-DL cannot achieve the accurate localization of defect-inducing code lines in a commit without JIT-DP. We hypothesize that the two JIT tasks can be combined together to boost the accurate prediction and localization of defect-inducing commits by integrating semantic features with expert features. Therefore, we propose to build a unified model, JIT-Fine, for the just-in-time defect prediction and localization by leveraging the best of semantic features and expert features. To assess the feasibility of JIT-Fine, we first build a large-scale line-level manually labeled dataset, JIT-Defects4J. Then, we make a comprehensive comparison with six state-of-the-art baselines under various settings using ten performance measures grouped into two types: effort-agnostic and effort-aware. The experimental results indicate that JIT-Fine can outperform all state-of-the-art baselines on both JIT-DP and JITDL tasks in terms of ten performance measures with a substantial improvement (i.e., 10%-629% in terms of effort-agnostic measures on JIT-DP, 5%-54% in terms of effort-aware measures on JIT-DP, and 4%-117% in terms of effort-aware measures on JIT-DL).
Chao Ni 0001, Wei Wang 0087, Xin Xia 0001, Kui Liu 0001, David Lo 0001
ESEC/SIGSOFT FSE2
2010 PDMS prism-glass optical coupling for surface plasmon resonance sensors based on MEMS technology
Zhaoxin Geng, Wei Wang 0087
Sci. China Inf. Sci.3
2008 Nanoparticle-based lift-off technique for ultra-thin nanoporous film preparation
Wei Wang 0087, YinHua Lei
Sci. China Ser. F Inf. Sci.1