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Chunmei Hu

dblp:35/7328 · DBLP profile ↗
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2ranked-venue papers
0as first author
0since 2021 · last 2017
—ORCID · unresolved

Domains — the database's venue-derived domains; a paper can count in several

Applied, interdisciplinary, general and emerging computing · 2

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
2 papers
Hardware reliability and fault tolerance · 94% Integrated circuit design · 6%

Topics — the 3 heaviest of 4, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Hardware reliability and fault tolerance
soft errors		 0.522017
Comparison of single-event upset generated by heavy ion and pulsed laser · Sci. China Inf. Sci. 2017
Simulation study of N-hit SET variation in differential cascade voltage switch logical circuits · Sci. China Inf. Sci. 2015
Hardware reliability and fault tolerance › soft errors
single-event upset		 0.312017
Comparison of single-event upset generated by heavy ion and pulsed laser · Sci. China Inf. Sci. 2017
Hardware reliability and fault tolerance › soft errors
single event transient		 0.212015
Simulation study of N-hit SET variation in differential cascade voltage switch logical circuits · Sci. China Inf. Sci. 2015

Methods — techniques the papers use, named apart from their topics

pulsed laser testing · 0.3heavy ion testing · 0.3simulation · 0.2
YearPublicationVenuePosition
2017 Comparison of single-event upset generated by heavy ion and pulsed laser
Ruiqiang Song, Jianwei Han, Yaqing Chi, Rui Chen 0038, Chunmei Hu, Yingqi Ma, Shipeng Shangguan
 Sci. China Inf. Sci.6
2015 Simulation study of N-hit SET variation in differential cascade voltage switch logical circuits
Pengcheng Huang 0003, Shuming Chen, Zhengfa Liang, Chunmei Hu, Biwei Liu
 Sci. China Inf. Sci.6