As chip manufacturing approaches physical limits, the probability of defects due to specific chip layout structures has significantly increased. These defect-prone structures are known as lithographic hotspots. Pattern matching method is widely used in hotspot detection algorithms due to its efficiency and accuracy. However, traditional pattern matching algorithms face major challenges in both solution efficiency and flexibility for fuzzy matching. To overcome these limitations, an integer range-based deterministic finite automaton (r-DFA)-based layout pattern matching method supporting parallelization and fuzzy matching is proposed. Manhattan polygons in the layout are represented as multiple path strings, thereby transforming the pattern matching problem into a string regular expression search problem. To simplifies the construction of large integer range elements in fuzzy matching, the r-DFA is employed, enhancing construction efficiency and enabling the algorithm to achieve linear time complexity. Moreover, this approach focuses most of the matching process within each individual layout polygon, enabling parallelized matching across diverse layout polygons. Compared to the state-of-the-art, our approach supports fuzzy matching, and shows an average efficiency improvement of 1.23 times.

With the development of distributed machine learning and federated learning, the solution to the data island problem is promoted. People use computer clusters to train machine learning models on data distributed in different regions. In the early stage of research, researchers usually assume that the data sets of each node are independent identically distribution (IID), but this is a strong assumption, which is challenging to meet in practical applications. Therefore, research on non-IID has become a hot spot in recent years. However, there is no uniform standard for designing and evaluating non-IID scenarios. This paper proposes a Frechet distance-independent non-IID distribution dataset metric MDFD. And we conducted experiments on different types of distributed machine-learning methods in different non-IID scenarios to verify the effectiveness of MDFD.