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Katsuya Satoh

dblp:37/2415 · DBLP profile ↗
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1ranked-venue papers
0as first author
0since 2021 · last 1987
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Electronic design automation · 100%

Topics — the 3 heaviest of 3, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation › hardware verification and test
fault simulation
0.011987
RFSIM: Reduced Fault Simulator · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1987
Electronic design automation
hardware verification and test
0.011987
RFSIM: Reduced Fault Simulator · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1987
Electronic design automation › hardware verification and test › fault simulation
concurrent fault simulation
0.011987
RFSIM: Reduced Fault Simulator · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1987

Methods — techniques the papers use, named apart from their topics

detectable fault only principle · 0.0candidate gate once principle · 0.0
YearPublicationVenuePosition
1987 RFSIM: Reduced Fault Simulator
abstract
This paper describes the algorithm, implementation, and evaluation results of a new fault simulator called RFSIM, which is designed for combinational circuits. In order to accelerate fault simulation, two basic principles are introduced, a Detectable Fault Only (DFO) principle and a Candidate Gate Once (CGO) principle. The DFO principle is a dynamic reduction algorithm, which aims at drastically reducing computational complexity by utilizing blocking gate information. The CGO principle is an implementation technique which is utilized to implement the DFO principle effectively. Experimental results show that RFSIM is more than 10 times faster than a conventional concurrent fault simulator, and confirms that the DFO principle contributes to a drastic reduction in the number of faults to be simulated. A fault reduction ratio of around 25 to 1 was achieved in one of the benchmark circuits.
Takao Nishida, Shunsuke Miyamoto, Tokinori Kozawa, Katsuya Satoh
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.4