Satoshi Akahane

dblp:376/6384 · DBLP profile ↗
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1ranked-venue papers
0as first author
1since 2021 · last 2025
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Artificial intelligence and machine learning · 1 · 1 since 2021

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Artificial intelligence
1 paper
Efficient and distributed learning · 50% Probabilistic and Bayesian machine learning · 50%

Topics — the 2 heaviest of 2, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Machine learning › Efficient and distributed learning
active learning
0.912025
Distributionally Robust Active Learning for Gaussian Process Regression · ICML 2025
Machine learning › Probabilistic and Bayesian machine learning › stochastic processes › gaussian process
gaussian process regression
0.912025
Distributionally Robust Active Learning for Gaussian Process Regression · ICML 2025

Methods — techniques the papers use, named apart from their topics

distributionally robust learning · 0.9
YearPublicationVenuePosition
2025 Distributionally Robust Active Learning for Gaussian Process Regression
abstract
Gaussian process regression (GPR) or kernel ridge regression is a widely used and powerful tool for nonlinear prediction. Therefore, active learning (AL) for GPR, which actively collects data labels to achieve an accurate prediction with fewer data labels, is an important problem. However, existing AL methods do not theoretically guarantee prediction accuracy for target distribution. Furthermore, as discussed in the distributionally robust learning literature, specifying the target distribution is often difficult. Thus, this paper proposes two AL methods that effectively reduce the worst-case expected error for GPR, which is the worst-case expectation in target distribution candidates. We show an upper bound of the worst-case expected squared error, which suggests that the error will be arbitrarily small by a finite number of data labels under mild conditions. Finally, we demonstrate the effectiveness of the proposed methods through synthetic and real-world datasets.
Shion Takeno, Yoshito Okura, Yu Inatsu, Tatsuya Aoyama, Tomonari Tanaka, Satoshi Akahane, Hiroyuki Hanada, Noriaki Hashimoto, Taro Murayama, Hanju Lee, Shinya Kojima, Ichiro Takeuchi
ICML6