Demo Data from VLDB 2026 / reviewers in the wild / expert
Dingrong Pan
dblp:393/0492
· DBLP profile ↗
2ranked-venue papers
0as first author
2since 2021 · last 2025
—ORCID · unresolved
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 2 · 2 since 2021
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 100% |
Topics — the 2 heaviest of 2, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation
hardware verification and test |
0.9 | 1 | 2025 | UVLLM: An Automated Universal RTL Verification Framework using LLMs · DAC 2025 |
Electronic design automation › hardware verification and test › functional verification
RTL verification |
0.9 | 1 | 2025 | UVLLM: An Automated Universal RTL Verification Framework using LLMs · DAC 2025 |
Methods — techniques the papers use, named apart from their topics
universal verification methodology · 0.9large language model · 0.9
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2025 | UVLLM: An Automated Universal RTL Verification Framework using LLMsabstractVerifying hardware designs in embedded systems is crucial but often labor-intensive and time-consuming. While existing solutions have improved automation, they frequently rely on unrealistic assumptions. To address these challenges, we introduce a novel framework, UVLLM, which combines Large Language Models (LLMs) with the Universal Verification Methodology (UVM) to relax these assumptions. UVLLM significantly enhances the automation of testing and repairing error-prone Register Transfer Level (RTL) codes, a critical aspect of verification development. Unlike existing methods, UVLLM ensures that all errors are triggered during verification, achieving a syntax error fix rate of 86.99% and a functional error fix rate of 71.92% on our proposed benchmark. These results demonstrate a substantial improvement in verification efficiency. Additionally, our study highlights the current limitations of LLM applications, particularly their reliance on extensive training data. We emphasize the transformative potential of LLMs in hardware design verification and suggest promising directions for future research in AI-driven hardware design methodologies. The Repo. of dataset and code: https://github.com/SEU-ACAL/reproduce-UVLLM-DAC-25/. Junhao Ye, Xinyao Jiao, Dingrong Pan, Jie Zhou 0001, Ning Wang 0071, Weiwei Shan, Xinwei Fang, Xi Wang 0009, Nan Guan, Zhe Jiang 0004 |
DAC | 7 |
| 2025 | From Concept to Practice: an Automated LLM-aided UVM Machine for RTL VerificationabstractVerification presents a major bottleneck in Integrated Circuit (IC) development, consuming nearly 70% of the total development effort. While the Universal Verification Methodology (UVM) is widely used in industry to improve verification efficiency through structured and reusable testbenches, constructing these testbenches and generating sufficient stimuli remain challenging. These challenges arise from the considerable manual coding effort required, repetitive manual execution of multiple EDA tools, and the need for in-depth domain expertise to navigate complex designs. Here, we present UVM2, an automated verification framework that leverages Large Language Models (LLMs) to generate UVM testbenches and iteratively refine them using coverage feedback, significantly reducing manual effort while maintaining rigorous verification standards. To evaluate UVM2, we introduce a benchmark suite comprising Register Transfer Level (RTL) designs of up to 1.6K lines of code. The results show that UVM2reduces testbench setup time by up to 38.82× compared to experienced engineers, and achieve average code and function coverage of 87.44% and 89.58%, outperforming state- of-the-art solutions by 20.96% and 23.51%, respectively. Junhao Ye, Dingrong Pan, Qichun Chen, Jie Zhou 0001, Shuai Zhao 0004, Xinwei Fang, Xi Wang 0009, Nan Guan, Zhe Jiang 0004 |
ICCAD | 4 |