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Dong-Jin Oh

dblp:40/3529 · DBLP profile ↗
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1ranked-venue papers
0as first author
0since 2021 · last 2004
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Computer networks · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer networks
1 paper
Physical-layer communications · 91% Cellular and mobile networks · 9%

Topics — the 4 heaviest of 4, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Physical-layer communications
channel modeling
0.012004
Statistical modeling of W-CDMA signals for use over frequency-selective multipath channels · IEEE Trans. Commun. 2004
Physical-layer communications › fading channels
multipath fading
0.012004
Statistical modeling of W-CDMA signals for use over frequency-selective multipath channels · IEEE Trans. Commun. 2004
Physical-layer communications
statistical modeling
0.012004
Statistical modeling of W-CDMA signals for use over frequency-selective multipath channels · IEEE Trans. Commun. 2004
Cellular and mobile networks › 3g network
WCDMA
0.012004
Statistical modeling of W-CDMA signals for use over frequency-selective multipath channels · IEEE Trans. Commun. 2004

Methods — techniques the papers use, named apart from their topics

goodness-of-fit test · 0.0chi-square test · 0.0
YearPublicationVenuePosition
2004 Statistical modeling of W-CDMA signals for use over frequency-selective multipath channels
abstract
This letter presents a mathematical model for the statistics of wideband code-division multiple-access signals which experience multipath fading. The statistics are obtained from numerically generated signals, and are then modeled with an offset noncentral chi distribution with three degrees of freedom. The mathematical model is tested against the numerically generated data by the use of a chi-square goodness-of-fit test.
Cheol-Sung Kim, Dong-Jin Oh, Laurence B. Milstein
IEEE Trans. Commun.2