Nobuo Wakatsuki

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3ranked-venue papers

0as first author

0since 2021 · last 1978

—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 3

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems

3 papers

Electronic design automation · 93% Integrated circuit design · 7%

Topics — the 4 heaviest of 5, each with the papers that count most for it

Topic	Papers	Last	Evidence papers
Electronic design automation hardware verification and test	3	1978	Automatic System Level Test Generation and Fault Location for Large Digital Systems · DAC 1978 Automatic test generation for large digital circuits · DAC 1977 Test generation systems in Japan · DAC 1975
Electronic design automation › hardware verification and test test generation	3	1978	Automatic System Level Test Generation and Fault Location for Large Digital Systems · DAC 1978 Automatic test generation for large digital circuits · DAC 1977 Test generation systems in Japan · DAC 1975
Electronic design automation › hardware test fault localization	1	1978	Automatic System Level Test Generation and Fault Location for Large Digital Systems · DAC 1978
Electronic design automation › hardware verification and test › test generation › high-level test generation system-level test generation	1	1978	Automatic System Level Test Generation and Fault Location for Large Digital Systems · DAC 1978

Year	Publication	Venue	Position
1978	Automatic System Level Test Generation and Fault Location for Large Digital Systems Akihiko Yamada, Nobuo Wakatsuki, T. Fukui, Shigehiro Funatsu	DAC	2
1977	Automatic test generation for large digital circuits Akihiko Yamada, Nobuo Wakatsuki, Hideo Shibano, Osamu Itoh, Kyoji Tomita, Shigehiro Funatsu	DAC	2
1975	Test generation systems in Japan Shigehiro Funatsu, Nobuo Wakatsuki, Toshihiro Arima	DAC	2