Demo Data from VLDB 2026 / reviewers in the wild / expert
Rex E. Lowther
dblp:49/3574
· DBLP profile ↗
3ranked-venue papers
2as first author
0since 2021 · last 1993
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 3 · 2 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
2 papers |
Electronic design automation · 75% Integrated circuit design · 25% | |
| Interdisciplinary, comprehensive, and emerging computing
1 paper |
Computational science and engineering · 100% |
Topics — the 4 heaviest of 4, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation › technology computer-aided design
process simulation |
0.0 | 1 | 1993 | Automatic grid refinement and higher order flux discretization for diffusion modeling · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1993 |
Electronic design automation › technology computer-aided design
device simulation |
0.0 | 1 | 1988 | The solution of a numerical problem encountered when adding a mobility model to a finite-element device simulator · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1988 |
Integrated circuit design
semiconductor device modeling |
0.0 | 1 | 1988 | The solution of a numerical problem encountered when adding a mobility model to a finite-element device simulator · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1988 |
Computational science and engineering
numerical simulation |
0.0 | 1 | 1993 | Automatic grid refinement and higher order flux discretization for diffusion modeling · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1993 |
Methods — techniques the papers use, named apart from their topics
higher order flux discretization · 0.0adaptive grid refinement · 0.0numerical convergence analysis · 0.0finite element method · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1993 | Automatic grid refinement and higher order flux discretization for diffusion modelingabstractThe authors point out that modern numerical process simulators are becoming increasingly complicated in both physical models and domain shape. Grid generation is difficult for these simulators because of the inherently transient nature of the problems being solved. Here, adaptive grid refinement is considered for use in solving diffusion problems. Higher order approximations to the discretized diffusion flux are also studied. Several methods of both adaptive grid refinement and discretization are investigated and compared in terms of CPU time and final discretization error. All the methods are directly applied to the one-dimensional version of SUPREM-IV.> Chih-Chuan Lin, Mark E. Law, Rex E. Lowther |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 3 |
| 1989 | A discretization scheme that allows coarse grid-spacing in finite-difference process simulationabstractThe central processing unit requirements of two-dimensional numerical process simulation require much larger typical grid spacings than those used in one-dimensional simulations. With these larger grid spacings, the discretization error in diffusion simulation can have a large effect on the final simulated profile. This discretization error is analyzed and a first-order correction is applied and compared to the standard discretization method. Results show that this correction allows for a significant increase in the allowed grid spacing. As a typical example, implantation and subsequent diffusion of arsenic into silicon was modeled with different grid spacings using the SUPREM-IV program (and all its default diffusion parameters) in a one-dimensional mode. In all cases, the total dose of the implant was a constant, and differences in the implantation profile width (due to the different grid spacings) were small enough to have no significant effect on the final diffused profiles. It is seen that the standard method overestimates the amount of diffusion. The proposed method shows much better agreement between the coarse and fine grids.> Rex E. Lowther |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 1 |
| 1988 | The solution of a numerical problem encountered when adding a mobility model to a finite-element device simulatorabstractThe addition of a mobility model to a finite-element simulator was found to create a convergence problem identified with the addition of positive terms to the off-diagonal elements in the solution matrix. Fast convergence rates were recovered by carefully adjusting the solution matrix such that the off-diagonal elements in question were all nonpositive.> Rex E. Lowther |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 1 |