Demonstration venue · read-only. Every page can be browsed; the buttons that would change it are switched off. Create an account to run TaxoReview on your own data. A simulation from public publication records: the people listed were not invited and did not agree to review.
? Tutorial for this page

Shunsuke Miyamoto

dblp:50/1664 · DBLP profile ↗
← Back
4ranked-venue papers
0as first author
0since 2021 · last 1998
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 4

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
3 papers
Electronic design automation · 96% Integrated circuit design · 4%

Topics — the 4 heaviest of 4, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation
hardware verification and test
0.031994
VFSIM: Vectorized Fault Simulator Using a Reduction Technique Excluding Temporarily Unobservable Faults · DAC 1994
Clock Event Suppression Algorithm of VELVET and Its Application to S-820 Development · DAC 1988
RFSIM: Reduced Fault Simulator · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1987
Electronic design automation › hardware verification and test
fault simulation
0.021994
VFSIM: Vectorized Fault Simulator Using a Reduction Technique Excluding Temporarily Unobservable Faults · DAC 1994
RFSIM: Reduced Fault Simulator · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1987
Integrated circuit design
low-power circuit design
0.011988
Clock Event Suppression Algorithm of VELVET and Its Application to S-820 Development · DAC 1988
Electronic design automation › hardware verification and test › fault simulation
concurrent fault simulation
0.011987
RFSIM: Reduced Fault Simulator · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1987

Methods — techniques the papers use, named apart from their topics

vectorization · 0.0pattern parallelism · 0.0event-driven simulation · 0.0detectable fault only principle · 0.0candidate gate once principle · 0.0
YearPublicationVenuePosition
1998 Effective Simulation for the Giga-scale Massively Parallel Supercomputer SR2201
abstract
A high performance parallel network simulation environment was developed in the SR2201 project, The SR2201 is one of the highest performance massively parallel supercomputers in the world. The enhanced simulation algorithm achieved a 2.4 times increase in simulation speed compared with conventional simulation methodology. A 98% detection rate for all design errors before physical design contributed to the shortening of development time.
Kaoru Suzuki, Shunsuke Miyamoto, Masato Kurosaki, Junji Nakagoshi
ASP-DAC2
1994 VFSIM: Vectorized Fault Simulator Using a Reduction Technique Excluding Temporarily Unobservable Faults
abstract
A new fault simulator (VFSIM) for synchronous sequential circuits has been developed and applied to random access scan circuits of several hundred LSIs in mainframe computers.The results show that VFSIM is one or two orders of magnitude faster than a conventional fault simulator designed for random access scan circuits.A vectorized pattern parallel event-driven method is introduced for accelerating the fault simulator for synchronous sequential circuits.Utilizing the concept of unobservable regions (UOR), in which simulation of temporarily unobservable faults is avoided, contributes greatly to further acceleration, especially for random access scan circuits.
Takaharu Nagumo, Masahiko Nagai, Takao Nishida, Masayuki Miyoshi, Shunsuke Miyamoto
DAC5
1988 Clock Event Suppression Algorithm of VELVET and Its Application to S-820 Development
Yoshio Takamine, Shunsuke Miyamoto, Shigeo Nagashima, Masayuki Miyoshi, Shun Kawabe
DAC2
1987 RFSIM: Reduced Fault Simulator
abstract
This paper describes the algorithm, implementation, and evaluation results of a new fault simulator called RFSIM, which is designed for combinational circuits. In order to accelerate fault simulation, two basic principles are introduced, a Detectable Fault Only (DFO) principle and a Candidate Gate Once (CGO) principle. The DFO principle is a dynamic reduction algorithm, which aims at drastically reducing computational complexity by utilizing blocking gate information. The CGO principle is an implementation technique which is utilized to implement the DFO principle effectively. Experimental results show that RFSIM is more than 10 times faster than a conventional concurrent fault simulator, and confirms that the DFO principle contributes to a drastic reduction in the number of faults to be simulated. A fault reduction ratio of around 25 to 1 was achieved in one of the benchmark circuits.
Takao Nishida, Shunsuke Miyamoto, Tokinori Kozawa, Katsuya Satoh
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.2