Demo Data from VLDB 2026 / reviewers in the wild / expert
M. P. Weir
dblp:51/186
· DBLP profile ↗
1ranked-venue papers
0as first author
0since 2021 · last 1990
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Artificial intelligence and machine learning · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer graphics and multimedia
1 paper |
Computational photography and imaging · 100% |
Topics — the 2 heaviest of 2, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Computational photography and imaging
3d imaging |
0.0 | 1 | 1990 | High-Speed Triangulation-Based 3-D Imaging with Orthonormal Data Projections and Error Detection · IEEE Trans. Pattern Anal. Mach. Intell. 1990 |
Computational photography and imaging
image sensor |
0.0 | 1 | 1990 | High-Speed Triangulation-Based 3-D Imaging with Orthonormal Data Projections and Error Detection · IEEE Trans. Pattern Anal. Mach. Intell. 1990 |
Methods — techniques the papers use, named apart from their topics
error detection · 0.0charge-injection-device sensing · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1990 | High-Speed Triangulation-Based 3-D Imaging with Orthonormal Data Projections and Error DetectionabstractImprovements to the triangulation range-sensing technique are described. The improvements greatly increase the range-data collection rate, while simultaneously providing for improved data integrity and a low-cost implementation. These benefits are achieved by using some unique abilities of the charge-injection-device image sensor. A laser-based investigation system has been built around a personal computer and used to evaluate the effectiveness of the improvements. Range data results are shown for the proposed application of printed-circuit board inspection.> Daniel D. Harrison, M. P. Weir |
IEEE Trans. Pattern Anal. Mach. Intell. | 2 |