Fourier-transform infrared spectroscopy (FTIR) is a widely adopted technique for characterizing the chemical composition in many physical and chemical analyses. However, FTIR spectra are subject to multiple sources of uncertainty, and thus the analysis of them relies on domain experts and can only lead to qualitative conclusions. This study aims to analyze the effect of a certain treatment on FTIR spectra subject to two commonly observed uncertainties, the offset shift and the multiplicative error. Due to these uncertainties, the pre-exposure FTIR spectra are modeled according to the physical understanding of the uncertainty—observed spectra can be viewed as translating and stretchering an underlying template signal, and the post-exposure FTIR spectra are modeled as the translated and stretchered template signal plus an extra functional treatment effect. To provide engineering interpretation, the treatment effect is modeled as the product of the pattern of modification and its corresponding magnitude. A two-step parameter estimation algorithm is developed to estimate the underlying template signal, the pattern of modification, and the magnitude of modification at various treatment strengths. The effectiveness of the proposed method is validated in a simulation study. Furtherly, in a real case study, the proposed method is used to investigate the effect of plasma exposure on the FTIR spectra. As a result, the proposed method effectively identifies the pattern of modification under uncertainties in the manufacturing environment, which matches the knowledge of the affected chemical components by the plasma treatment. And the recovered magnitude of modification provides guidance in selecting the control parameter of the plasma treatment.Note to Practitioners—FTIR spectrometer is often used to characterize the surface chemical composition of a material. Due to the large uncertainties associated with the nature of spectrometer and the measurement environment, the FTIR signals are usually examined visually by experienced engineers and technicians in industrial applications, which can be both time-consuming and inaccurate. To understand the effect of plasma exposure on the surface property of carbon fiber reinforced polymer (CFRP) material, the elimination of uncertainties associated with FTIR signals is investigated, and a systematic method is proposed to quantify the effect of surface treatments on FTIR signals. A two-step analytic procedure is proposed, which provides information on how the plasma exposure distorts the FTIR signals, and how the plasma distance relates to the magnitude of the distortion. The methodology in this article can be used to analyze the treatment effect on a variety of spectroscopic measurements that are subject to uncertainties such as offset and scaling errors, which expands the applications of in situ handheld spectrometer metrology in manufacturing industries.

The great success achieved by deep neural networks attracts increasing attention from the manufacturing and healthcare communities. However, the limited availability of data and high costs of data collection are the major challenges for the applications in those fields. We propose in this work AISEL, an active image synthesis method for efficient labeling, to improve the performance of the small-data learning tasks. Specifically, a complementary AISEL dataset is generated, with labels actively acquired via a physics-based method to incorporate underlining physical knowledge at hand. An important component of our AISEL method is the bidirectional generative invertible network (GIN), which can extract interpretable features from the training images and generate physically meaningful virtual images. Our AISEL method then efficiently samples virtual images not only further exploits the uncertain regions but also explores the entire image space. We then discuss the interpretability of GIN both theoretically and experimentally, demonstrating clear visual improvements over the benchmarks. Finally, we demonstrate the effectiveness of our AISEL framework on aortic stenosis application, in which our method lowers the labeling cost by 90 percent while achieving a 15 percent improvement in prediction accuracy.

Process monitoring and quality control is essential for continuous manufacturing processes of carbon nano- tube (CNT) thin sheets or buckypaper. Raman spectroscopy is an attractive inline quality characterization and quantification tool for nanomanufacturing because of its nondestructive nature, fast data acquisition speed, and ability to provide detailed material information. However, there is signal-dependent noise buried in the Raman spectra, which reduces the signal-to-noise (S/N) ratio and affects the accuracy, efficiency, and sensitivity for Raman spectrum-based quality control approaches. In this paper, a signal analysis model with signal-dependent noise for Raman spectroscopy is developed and validated based on experimental data. The wavelet shrinkage method is used for denoising and improving the S/N ratio of raw Raman spectra. Based on the validated signal-noise relationship, a novel generalized wavelet shrinkage approach is introduced to remove noise in all wavelet coefficients by applying individual adaptive wavelet thresholds. The effectiveness of this method is demonstrated using both simulation and experimental case studies of inline Raman monitoring of continuous buckypaper manufacturing. The proposed method allows for a significant reduction of Raman data acquisition time without much loss of S/N ratio, which inherently enables Raman spectroscopy for inline monitoring and control for continuous nanomanufacturing processes.