Demo Data from VLDB 2026 / reviewers in the wild / expert
Shirley Mills
dblp:55/3710
· DBLP profile ↗
1ranked-venue papers
0as first author
0since 2021 · last 1996
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Software engineering, systems software and programming languages · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Software engineering, system software, and programming languages
1 paper |
Software testing · 100% |
Topics — the 3 heaviest of 3, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Software testing
random testing |
0.0 | 1 | 1996 | A Binary Markov Process Model for Random Testing · IEEE Trans. Software Eng. 1996 |
Software testing › software reliability
reliability estimation |
0.0 | 1 | 1996 | A Binary Markov Process Model for Random Testing · IEEE Trans. Software Eng. 1996 |
Software testing
software reliability |
0.0 | 1 | 1996 | A Binary Markov Process Model for Random Testing · IEEE Trans. Software Eng. 1996 |
Methods — techniques the papers use, named apart from their topics
binomial distribution model · 0.0binary markov process · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1996 | A Binary Markov Process Model for Random TestingabstractA binary Markov process model is proposed for the random testing of software. This model is suggested for replacing the standard binomial distribution model, which is based on the easily-violated assumption of test runs being statistically independent of each other. In addition to a general result on the probability of having any specific number of software failures during testing, practical implications of the new model are also discussed. In particular, we demonstrate that, in general, the effect of a possible correlation between test runs cannot be ignored in estimating software reliability. Sanping Chen, Shirley Mills |
IEEE Trans. Software Eng. | 2 |