Demo Data from VLDB 2026 / reviewers in the wild / expert
William C. Carter
dblp:58/275
· DBLP profile ↗
9ranked-venue papers
7as first author
0since 2021 · last 1982
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 9 · 7 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
7 papers |
Hardware reliability and fault tolerance · 53% Electronic design automation · 28% Distributed systems · 14% | |
| Software engineering, system software, and programming languages
1 paper |
Operating systems · 100% |
Topics — the 14 heaviest of 14, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Hardware reliability and fault tolerance › error correction
error-correcting codes |
0.0 | 3 | 1976 | Implementation of an Experimental Fault-Tolerant Memory System · IEEE Trans. Computers 1976 Lookaside Techniques for Minimum Circuit Memory Translators · IEEE Trans. Computers 1973 Modeling of a Bubble-Memory Organization with Self-Checking Translators to Achieve High Reliability · IEEE Trans. Computers 1973 |
Electronic design automation
hardware verification and test |
0.0 | 2 | 1979 | Symbolic simulation for correct machine design · DAC 1979 A Simple Self-Testing Decoder Checking Circuit · IEEE Trans. Computers 1971 |
Hardware reliability and fault tolerance
memory fault tolerance |
0.0 | 2 | 1976 | Implementation of an Experimental Fault-Tolerant Memory System · IEEE Trans. Computers 1976 Modeling of a Bubble-Memory Organization with Self-Checking Translators to Achieve High Reliability · IEEE Trans. Computers 1973 |
Hardware reliability and fault tolerance › error correction › error-correcting codes
SECDED |
0.0 | 2 | 1976 | Implementation of an Experimental Fault-Tolerant Memory System · IEEE Trans. Computers 1976 Lookaside Techniques for Minimum Circuit Memory Translators · IEEE Trans. Computers 1973 |
Distributed systems › fault tolerance
failure recovery |
0.0 | 2 | 1976 | Implementation of an Experimental Fault-Tolerant Memory System · IEEE Trans. Computers 1976 Logic Design for Dynamic and Interactive Recovery · IEEE Trans. Computers 1971 |
Electronic design automation › hardware verification and test › formal verification
symbolic simulation |
0.0 | 1 | 1979 | Symbolic simulation for correct machine design · DAC 1979 |
Hardware reliability and fault tolerance
reliability modeling |
0.0 | 2 | 1973 | Reliability Modeling for Fault-Tolerant Computers · IEEE Trans. Computers 1971 Modeling of a Bubble-Memory Organization with Self-Checking Translators to Achieve High Reliability · IEEE Trans. Computers 1973 |
Hardware reliability and fault tolerance
error correction |
0.0 | 1 | 1973 | Lookaside Techniques for Minimum Circuit Memory Translators · IEEE Trans. Computers 1973 |
Memory systems › magnetic memory
magnetic bubble memory |
0.0 | 1 | 1973 | Modeling of a Bubble-Memory Organization with Self-Checking Translators to Achieve High Reliability · IEEE Trans. Computers 1973 |
Electronic design automation › hardware verification and test › design for testability
built-in self-test |
0.0 | 1 | 1971 | A Simple Self-Testing Decoder Checking Circuit · IEEE Trans. Computers 1971 |
Distributed systems › fault tolerance
checkpointing |
0.0 | 1 | 1971 | Logic Design for Dynamic and Interactive Recovery · IEEE Trans. Computers 1971 |
Hardware reliability and fault tolerance
self-checking circuits |
0.0 | 1 | 1971 | A Simple Self-Testing Decoder Checking Circuit · IEEE Trans. Computers 1971 |
Operating systems › system architecture
hardware-software interface |
0.0 | 1 | 1971 | Logic Design for Dynamic and Interactive Recovery · IEEE Trans. Computers 1971 |
Operating systems › fault tolerance
system recovery |
0.0 | 1 | 1971 | Logic Design for Dynamic and Interactive Recovery · IEEE Trans. Computers 1971 |
Methods — techniques the papers use, named apart from their topics
symbolic simulation · 0.0self-testing translator/corrector · 0.0self-checking circuit design · 0.0parity check matrix · 0.0hamming code · 0.0firmware-based correction · 0.0fault insertion · 0.0error-correcting codes · 0.0self-checking logic design · 0.0recovery control unit · 0.0mathematical reliability modeling · 0.0audit routines · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1982 | Signature Testing with Guaranteed Bounds for Fault Coverage
William C. Carter |
ITC | 1 |
| 1979 | Symbolic simulation for correct machine design
William C. Carter, William H. Joyner Jr., Daniel Brand |
DAC | 1 |
| 1976 | Implementation of an Experimental Fault-Tolerant Memory SystemabstractThe experimental fault-tolerant memory system described in this paper has been designed to enable the modular addition of spares, to validate the theoretical fault-secure and self-testing properties of the translator/corrector, to provide a basis for experiments using the new testing and correction processes for recovery, and to determine the practicality of such systems. The hardware design and implementation are described, together with methods of fault insertion. The hardware/ software interface, including a restricted single error correction/double error detection (SEC/DED) code, is specified. Procedures are carefully described which, 1) test for specified physical faults, 2) ensure that single error corrections are not miscorrections due to triple faults, and 3) enable recovery from double errors. William C. Carter, Charles E. McCarthy |
IEEE Trans. Computers | 1 |
| 1973 | Modeling of a Bubble-Memory Organization with Self-Checking Translators to Achieve High ReliabilityabstractThis paper reports a study on the design and modeling of a highly reliable bubble-memory system. This system has the capability of correcting a single 16-adjacent bit-group error resulting from failures in a single basic storage module (BSM), and detecting with a probability greater than 0.99 any double errors resulting from failures in BSM's. The encoding/decoding network (memory translator) is designed to be self-checking, i.e., a single circuit failure in the translator wiH not produce an erroneous output that goes undetected. The system is able to perform reliable configuration in the event of uncorrectable BSM failures, memory translator failures, and dual-memory buffer failures; even in the presence of a single failure in the status registers controlling the configuration network. The bubble memory under study permits serial accessing of the store with 64 x 1024 bit blocks at a 100-kHz rate. The objective of this study is to develop good fault-tolerant design and analysis methods adequate for newly emerging technologies and prove the practicality by example. The reliability modeling study justifies the design philosophy adopted of employing memory data encoding and a translator to correct single group errors and detect double group errors to enhance the overall system reliability. By a proper design of the memory translator based on a new checking technique, a uniformly high percentage of multiple b-adjacent bit-group error detection is achieved through the use of a proposed code (detects 99.99695 percent of double b-adjacent bit-group errors and 99.9985 percent of triple or more b-adjacent bit-group errors). Willard G. Bouricius, William C. Carter, Edward P. Hsieh, Donald C. Jessep Jr., Aspi B. Wadia |
IEEE Trans. Computers | 2 |
| 1973 | Fault-Tolerant Computing: An Introduction and a ViewpointabstractAFTER approximately 20 years of obscurity, the field of fault-tolerant computing was revived by the formation of the IEEE Technical Committee on Fault-Tolerant Computing, by a series of articles in COMPUTER for January/ February 1971, by the 1971 International Symposium on Fault-Tolerant Computing in Pasadena, Calif., and by an IEEE TRANSACTIONS ON COMPUTERS Special Issue on Fault-Tolerant Computing in November 1971. Interest and activity continued apace, and the 1972 International Symposium on Fault-Tolerant Computing was held in Newton, Mass. Most of the excellent papers in this second IEEE TRANSACTIONS Special Issue on Fault-Tolerant Computing were presented at that symposium. As an introduction to these papers, consideration of the ultimate goals of this discipline and the universe in which our work is being done is most appropriate. William C. Carter |
IEEE Trans. Computers | 1 |
| 1973 | Lookaside Techniques for Minimum Circuit Memory TranslatorsabstractThis paper demonstrates two improvements in coding techniques that could be used for memory word coding. First, within the fixed structure of a Hamming single-error-correcting, double-error-detecting (SEC/DED) code, an improvement can be obtained in circuit cost and operational speed over more conventional code implementations. Second, the mechanics of error correction in a fault-tolerant computer may be carried out via conventional hardware means or by use of the existing system facilities, such as the combination of the microprogram unit, local store, and the arithmetic-logic unit. These improvements may be obtained by the use of Rotational Coding schemes in conjunction with a technique calied "lookaside correction." This paper first shows a generalized algorithm for specifying the parity check matrix of Rotational Codes. The structure implemented by the parity check matrix in this paper is not merely encoding and decoding circuitry, but translates between Rotational Code forms and byte-parity encoded forms. The unique feature of these translators is that use of the Rotational Code permits the error correction to be performed on only a subset of the data word bits, and only if a single-error condition has been detected. The correction mechanism may be either a hardware logic circuit or firmware. The paper concludes with a comparison of the circuit requirements and correctional speed of the Hamming (72, 64) single-error-correcting, double-error-detecting code, as it normally would be implemented, and a Rotational Code translator also operating on 64 data bits and 8 check bits. William C. Carter, Keith A. Duke, Donald C. Jessep Jr. |
IEEE Trans. Computers | 1 |
| 1971 | Reliability Modeling for Fault-Tolerant ComputersabstractReliability modeling and the mathematical equations involved are discussed for general computer systems organized to be fault tolerant. This paper summarizes the work done over the last four years on mathematical reliability modeling by the authors. Willard G. Bouricius, William C. Carter, Donald C. Jessep, Peter R. Schneider, Aspi B. Wadia |
IEEE Trans. Computers | 2 |
| 1971 | A Simple Self-Testing Decoder Checking CircuitabstractA method is given of designing a simple self-checking and self-testing decoder checking circuit which uses much less circuitry than previous checkers. An analysis is given of the circuit savings and of the probability of erroneous decoder operation before error detection. William C. Carter, Keith A. Duke, Donald C. Jessep |
IEEE Trans. Computers | 1 |
| 1971 | Logic Design for Dynamic and Interactive RecoveryabstractRecovery in a fault-tolerant computer means the continuation of system operation with data integrity after an error occurs. This paper delineates two parallel concepts embodied in the hardware and software functions required for recovery; detection, diagnosis, and reconfiguration for hardware, data integrity, checkpointing, and restart for the software. The hardware relies on the recovery variable set, checking circuits, and diagnostics, and the software relies on the recovery information set, audit, and reconstruct routines, to characterize the system state and assist in recovery when required. Of particular utility is a handware unit, the recovery control unit, which serves as an interface between error detection and software recovery programs in the supervisor and provides dynamic interactive recovery. William C. Carter, Donald C. Jessep, Aspi B. Wadia, Peter R. Schneider, Willard G. Bouricius |
IEEE Trans. Computers | 1 |