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Robert G. Carpenter

dblp:58/3328 · DBLP profile ↗
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1ranked-venue papers
0as first author
0since 2021 · last 1975
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Electronic design automation · 100%

Topics — the 3 heaviest of 3, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation
hardware verification and test		 0.011975
The Weighted Random Test-Pattern Generator · IEEE Trans. Computers 1975
Electronic design automation › hardware verification and test
test generation		 0.011975
The Weighted Random Test-Pattern Generator · IEEE Trans. Computers 1975
Electronic design automation › hardware verification and test › random testing
weighted random pattern testing		 0.011975
The Weighted Random Test-Pattern Generator · IEEE Trans. Computers 1975

Methods — techniques the papers use, named apart from their topics

statistical random sequence generation · 0.0heuristic weighting · 0.0
YearPublicationVenuePosition
1975 The Weighted Random Test-Pattern Generator
abstract
A heuristic method for generating large-scale integration (LSI) test patterns is described. In particular, this paper presents a technique for generating statistically random sequences to test complex logic circuits. The algorithms used to obtain a set of tests by means of weighted logic signal variations are included. Several techniques for assigning these weights and for varying them are discussed on the basis of the primary algorithm. Also described is a means of obtaining a minimal number of test patterns. This approach has proved successful in obtaining fault-detecting patterns.
H. Daniel Schnurmann, Eric Lindbloom, Robert G. Carpenter
 IEEE Trans. Computers3