Michel Picard

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12ranked-venue papers
3as first author
3since 2021 · last 2025
—ORCID · conflict

Domains — the database's venue-derived domains; a paper can count in several

Software engineering, systems software and programming languages · 8 · 3 first-author · 2 since 2021Graphics, computer vision, multimedia, augmented reality and games · 3 · 1 since 2021Artificial intelligence and machine learning · 1
YearPublicationVenuePosition
2025 Multi-Frequency Nonlinear Methods for 3D Shape Measurement of Semi-Transparent Surfaces Using Projector-Camera Systems
abstract
Measuring the 3D shape of semi-transparent surfaces with projector-camera 3D scanners is a difficult task because these surfaces weakly reflect light in a diffuse manner, and transmit a large part of the incident light. The task is even harder in the presence of participating background surfaces. The two methods proposed in this paper use sinusoidal patterns, each with a frequency chosen in the frequency range allowed by the projection optics of the projector-camera system. They differ in the way in which the camera-projector correspondence map is established, as well as in the number of patterns and the processing time required. The first method utilizes the discrete Fourier transform, performed on the intensity signal measured at a camera pixel, to inventory projector columns illuminating directly and indirectly the scene point imaged by that pixel. The second method goes beyond discrete Fourier transform and achieves the same goal by fitting a proposed analytical model to the measured intensity signal. Once the one (camera pixel) to many (projector columns) correspondence is established, a surface continuity constraint is applied to extract the one to one correspondence map linked to the semi-transparent surface. This map is used to determine the 3D point cloud of the surface by triangulation. Experimental results demonstrate the performance (accuracy, reliability) achieved by the proposed methods.
Frank Billy Djupkep Dizeu, Michel Picard, Marc-Antoine Drouin, Jonathan Boisvert
IEEE Trans. Vis. Comput. Graph.2
2023 Digitalizing Process Assessment Approach: An Illustration with GDPR Compliance Self-assessment for SMEs
Stéphane Cortina, Michel Picard, Samuel Renault, Philippe Valoggia
EuroSPI (2)2
2021 Towards a Process-Based Approach to Compliance with GDPR
Stéphane Cortina, Michel Picard, Samuel Renault, Philippe Valoggia
EuroSPI2
2017 Motion Compensation for Phase-Shift Structured-Light Systems Based on a Total-Variation Framework
abstract
Phase-shift profilometry (PSP) is a technique for acquiring non-contact three-dimensional measurements using a projector and a camera. The technique can be used to measure 3D surfaces with high accuracy. However, it can be sensitive to motion because phase images are sequentially captured. We propose a new technique that uses residual phase errors to minimize the influence of motion on the recovered phases (and 3D points). The method minimizes residual phase error with respect to apparent phase offset variations caused by motion. Furthermore, a total variation scheme is used to minimize spatial variations of apparent phase offset variations. We demonstrate the method with different moving objects, and we also study the effect of the magnitude of the motion on the accuracy of the recovered phases. Visual artefacts as well as accuracy loss associated with motion are found to be significantly decreased.
Jonathan Boisvert, Marc-Antoine Drouin, Louis-Guy Dicaire, Michel Picard, Guy Godin
3DV4
2017 Characterizing the impact of optically induced blurring of a high-resolution phase-shift 3D scanner
Marc-Antoine Drouin, François Blais, Michel Picard, Jonathan Boisvert, J.-Angelo Beraldin
Mach. Vis. Appl.3
2016 Using a Process Assessment Model to Prepare for an ISO/IEC 20000-1 Certification: ISO/IEC 15504-8 or TIPA for ITIL?
Stéphane Cortina, Béatrix Barafort, Michel Picard, Alain Renault
EuroSPI3
2016 Measuring Readiness for Compliance: A Gap Analysis Tool to Complete the TIPA Process Assessment Framework
Michel Picard, Alain Renault, Béatrix Barafort, Stéphane Cortina
EuroSPI1
2015 An ISO Compliant and Integrated Model for IT GRC (Governance, Risk Management and Compliance)
Nicolas Mayer, Béatrix Barafort, Michel Picard, Stéphane Cortina
EuroSPI3
2015 A Maturity Model for ISO/IEC 20000-1 Based on the TIPA for ITIL Process Capability Assessment Model
Michel Picard, Alain Renault, Béatrix Barafort
EuroSPI1
2014 Assessing partially outsourced processes - lessons learned from TIPA assessments
abstract
ABSTRACT This paper presents three process assessments that took place in Luxembourg in 2012. It depicts the TIPA® process assessment framework and reports on its usage in three different partially outsourced contexts: a telecommunication service provider, a European institution, and a bank. Finally, this paper presents the lessons learned from these experimentations and some improvement perspectives. Copyright © 2014 John Wiley & Sons, Ltd.
Stéphane Cortina, Alain Renault, Michel Picard
J. Softw. Evol. Process.3
2010 How to Improve Process Models for Better ISO/IEC 15504 Process Assessment
Michel Picard, Alain Renault, Stéphane Cortina
EuroSPI1
2009 A framework for the registration of color images with 3D models
abstract
This paper describes an environment to automatically or semi-automatically compute the precise mapping between a set of 2D images and a triangulated 3D model built from high-resolution 3D range data. This environment is part of our Atelier3D framework for the modeling, visualization and analysis of large sensor-based datasets. This work was done to initially support three cultural heritage application projects: the modeling of the Grotta dei Cervi in Italy, of the Erechtheion in Athens, Greece, and of Leonardo's Mona Lisa. The proposed method combines image-based registration, feature matching, robust estimation techniques and advanced multi-resolution rendering with a powerful user interface.
Louis Borgeat, Guillaume Poirier, J.-Angelo Beraldin, Guy Godin, Philippe Massicotte, Michel Picard
ICIP6