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Steven Bova

dblp:62/1174 · DBLP profile ↗
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1ranked-venue papers
1as first author
0since 2021 · last 1995
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 1 · 1 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Interdisciplinary, comprehensive, and emerging computing
1 paper
Computational science and engineering · 100%
Computer architecture, parallel and distributed computing, and storage systems
1 paper
Integrated circuit design · 100%

Topics — the 3 heaviest of 3, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Computational science and engineering
finite element analysis
0.011995
A Taylor-Galerkin finite element method for the hydrodynamic semiconductor equations · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1995
Computational science and engineering
numerical simulation
0.011995
A Taylor-Galerkin finite element method for the hydrodynamic semiconductor equations · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1995
Integrated circuit design
semiconductor device modeling
0.011995
A Taylor-Galerkin finite element method for the hydrodynamic semiconductor equations · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1995

Methods — techniques the papers use, named apart from their topics

taylor-galerkin finite element method · 0.0characteristic projections · 0.0adaptive time iteration · 0.0
YearPublicationVenuePosition
1995 A Taylor-Galerkin finite element method for the hydrodynamic semiconductor equations
abstract
A new Taylor-Galerkin finite element method and adaptive, time-iterative scheme are developed for simulating single-carrier submicron-scale semiconductor device transport with the hydrodynamic model under the assumptions of parabolic energy bands. Boundary conditions are applied using characteristic projections. Numerical studies are conducted to investigate the sensitivity of the given model to some of the parameters contained in typical heat flux and relaxation time models for a one-dimensional, representative test problem.
Steven Bova, Graham F. Carey
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.1