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Wen-Feng Chang

dblp:62/6620 · DBLP profile ↗
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1ranked-venue papers
1as first author
0since 2021 · last 1999
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 1 · 1 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Hardware reliability and fault tolerance · 75% Integrated circuit design · 25%

Topics — the 4 heaviest of 4, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Integrated circuit design
digital circuit design
0.011999
Low-Cost Modular Totally Self-Checking Checker Design for m-out-of-n Code · IEEE Trans. Computers 1999
Hardware reliability and fault tolerance › fault-tolerant design › fault-tolerant circuit design
m-out-of-n code checker
0.011999
Low-Cost Modular Totally Self-Checking Checker Design for m-out-of-n Code · IEEE Trans. Computers 1999
Hardware reliability and fault tolerance
self-checking circuits
0.011999
Low-Cost Modular Totally Self-Checking Checker Design for m-out-of-n Code · IEEE Trans. Computers 1999
Hardware reliability and fault tolerance › self-checking circuits
totally self-checking checker
0.011999
Low-Cost Modular Totally Self-Checking Checker Design for m-out-of-n Code · IEEE Trans. Computers 1999

Methods — techniques the papers use, named apart from their topics

two-rail code checking · 0.0
YearPublicationVenuePosition
1999 Low-Cost Modular Totally Self-Checking Checker Design for m-out-of-n Code
abstract
We present a low-cost (hardware-efficient) and fast totally self-checking (TSC) checker for m-out-of-n code, where m/spl ges/3, 2m+1/spl les/n/spl les/4m. The checker is composed of four special adders which sum the 1s in the primary inputs added by appropriate constants, two ripple carry adders which sum the outputs of the biased-adders, and a t-variable two-rail code checker tree which compares the outputs of the two ripple carry adders, where k=[log/sub 2/(n-m)+1]. All the modules are composed of 2-input gates and inverters. Compared with previous nonmodular methods, our TSC checker has a lower hardware and time complexity. Our method reduces the hardware complexity and circuit delay of the checker from O(n/sup 2/) to O(n) and from O(n) to O(log/sub 2/n), respectively. Compared with recent modular methods, our TSC checker has about the same hardware and time complexity, but is applicable to a much broader range of n. In summary, our method is superior to existing methods for the considered range of n. In addition, our TSC checker can easily be tested (the test set size of our TSC checker is relatively small) and implemented in VLSI for its modular structure.
Wen-Feng Chang, Cheng-Wen Wu
IEEE Trans. Computers1