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William Bryson

dblp:63/5638 · DBLP profile ↗
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3ranked-venue papers
0as first author
0since 2021 · last 2012
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Security and privacy · 2Software engineering, systems software and programming languages · 2Systems, architecture and hardware · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Electronic design automation · 100%

Topics — the 3 heaviest of 3, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation › hardware test
counterfeit IC detection
0.112012
Can EDA combat the rise of electronic counterfeiting? · DAC 2012
Electronic design automation
hardware security
0.112012
Can EDA combat the rise of electronic counterfeiting? · DAC 2012
Electronic design automation
intellectual property protection
0.012012
Can EDA combat the rise of electronic counterfeiting? · DAC 2012
YearPublicationVenuePosition
2012 Can EDA combat the rise of electronic counterfeiting?
abstract
The Semiconductor Industry Associates (SIA) estimates that counterfeiting costs the US semiconductor companies $7.5B in lost revenue, and this is indeed a growing global problem. Repackaging the old ICs, selling the failed test parts, as well as gray marketing, are the most dominant counterfeiting practices. Can technology do a better job than lawyers? What are the technical challenges to be addressed? What EDA technologies will work: embedding IP protection measures in the design phase, developing rapid post- silicon certification, or counterfeit detection tools and methods?
Farinaz Koushanfar, Saverio Fazzari, Carl McCants, William Bryson, Matthew Sale, Peilin Song, Miodrag Potkonjak
DAC4
2009 Quantitative RAS Comparison of Sun CMT/Solaris and X86/Linux Servers
abstract
By incorporating the chip multi-threading (CMT) and operating system predictive self-healing technologies, the Sun CMT/Solaris based servers are not only cost/performance effective, but also more robust in reliability, availability, and serviceability (RAS) than the X86/Linux servers with similar performance. The differentiators include higher levels of hardware integration, more fault tolerance provisions in processors, the Solaris memory page retirement (MPR), and the Solaris/SPARC processor offlining (PO) capabilities of the CMT/Solaris server. This study applies analytical models, with parameters calibrated by field experience, to quantitatively compare system RAS, against hardware faults, between the CMT/Solaris and X86/Linux servers. The results show significant RAS benefits of the CMT, MPR, and PO technologies.
William Bryson
PRDC2
2008 RAS Modeling of an HPC Switch System
abstract
The high end of high performance computing (HPC) systems is now moving toward petascale deployments, delivering petaflops of computational capacity and petabytes of storage capacity. Interconnection of the sheer number of server nodes in an HPC system plays a vital role in the developments. InfiniBand has emerged as a compelling interconnect technology, and provides more scalability and significantly better cost- performance than any other known protocols. This paper presents a reliability, availability, and serviceability (RAS) modeling and analysis of the Sun Datacenter Switch 3456 system, the world's largest standards-based InfiniBand switch, with direct capacity to host up to 3,456 server nodes, against hardware faults. The results show that the system reliability, in terms of connectivity between the server nodes physically connected to the switch, is high for configurations with redundant ports. The study also shows that practicing deferred repair strategies can significantly reduce unscheduled service events and system downtime. Further, the study identifies optimal service strategies by a tradeoff analysis on reliability and availability.
William Bryson, Richard Elling
PRDC2