Dynamic binary translation (DBT) has been used to achieve numerous goals (e.g., better performance) for general-purpose computers. Recently, DBT has also attracted attention for embedded systems. However, a challenge to DBT in this domain is stringent constraints on memory and performance. The translated code buffer used by DBT may occupy too much memory space. This paper proposes novel schemes to manage this buffer with scratchpad memory. We use footprint reduction to minimize the space needed by the translated code, victim compression to reduce the cost of retranslating previously seen code, and fragment pinning to avoid evicting needed code. We comprehensively evaluate our techniques to demonstrate their effectiveness.

Producing reliable and robust software has become one of the most important software development concerns in recent years. Testing is a process by which software quality can be assured through the collection of information. While testing can improve software reliability, current tools typically are inflexible and have high over-heads, making it challenging to test large software projects. In this paper, we describe a new scalable and flexible framework for testing programs with a novel demand-driven approach based on execution paths to implement test coverage. This technique uses dynamic instrumentation on the binary code that can be inserted and removed on-the-fly to keep performance and memory overheads low. We describe and evaluate implementations of the framework for branch, node and defuse testing of Java programs. Experimental results for branch testing show that our approach has, on average, a 1.6 speed up over static instrumentation and also uses less memory.