Demo Data from VLDB 2026 / reviewers in the wild / expert
Michael R. Kump
dblp:67/4345
· DBLP profile ↗
1ranked-venue papers
1as first author
0since 2021 · last 1988
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 100% | |
| Interdisciplinary, comprehensive, and emerging computing
1 paper |
Computational science and engineering · 100% |
Topics — the 2 heaviest of 2, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation › technology computer-aided design
process and device simulation |
0.0 | 1 | 1988 | The efficient simulation of coupled point defect and impurity diffusion · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1988 |
Computational science and engineering › numerical simulation
semiconductor process simulation |
0.0 | 1 | 1988 | The efficient simulation of coupled point defect and impurity diffusion · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1988 |
Methods — techniques the papers use, named apart from their topics
multigrid · 0.0finite difference · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1988 | The efficient simulation of coupled point defect and impurity diffusionabstractA program has been developed which efficiently solves the coupled diffusion of interstitials, vacancies, and multiple impurity species in two dimensions. Due to the vast differences in diffusivities of the point defects and impurities, two separate spatial grids are used. A coarse grid is sufficient to represent the rapidly diffusing point defects, whereas a much finer grid is necessary to resolve the details of the impurity profile. Independent time steps are automatically selected for each species, permitting this extremely stiff system of diffusion equations to be solved in acceptable CPU time on a minicomputer. The simulation results are used to study the coupled diffusion of point defects and impurities under local oxidation conditions. Comparison with lap and stain measurements on structures with various widths of oxidizing and nitride-masked regions allows accurate values for numerous point defect diffusion parameters to be extracted.> Michael R. Kump, Robert W. Dutton |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 1 |