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Bonnie K. Ray

dblp:68/1162 · DBLP profile ↗
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6ranked-venue papers
1as first author
0since 2021 · last 2008
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Software engineering, systems software and programming languages · 4 · 1 first-authorArtificial intelligence and machine learning · 3 · 1 first-authorGraphics, computer vision, multimedia, augmented reality and games · 2

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Software engineering, system software, and programming languages
2 papers
Software testing · 47% Empirical software engineering · 44% Software maintenance and evolution · 8%

Topics — the 3 heaviest of 4, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Empirical software engineering
mining software repositories
0.012004
Empirical evaluation of defect projection models for widely-deployed production software systems · SIGSOFT FSE 2004
Software testing
software reliability
0.012004
Empirical evaluation of defect projection models for widely-deployed production software systems · SIGSOFT FSE 2004
Software maintenance and evolution › software quality assurance › defect analysis
defect classification
0.011992
Orthogonal Defect Classification - A Concept for In-Process Measurements · IEEE Trans. Software Eng. 1992

Methods — techniques the papers use, named apart from their topics

weibull model · 0.0moving averages · 0.0exponential smoothing · 0.0defect type distribution · 0.0defect trigger distribution · 0.0
YearPublicationVenuePosition
2008 On efficient Viterbi decoding for hidden semi-Markov models
abstract
We present algorithms for improved Viterbi decoding for the case of hidden semi-Markov models. By carefully constructing directed acyclic graphs, we pose the decoding problem as that of finding the longest path between specific pairs of nodes. We consider fully connected models as well as restrictive topologies and state duration conditions, and show that performance improves by a significant factor in all cases. Detailed algorithms as well as theoretical results related to their run times are provided.
Ritendra Datta, Jianying Hu, Bonnie K. Ray
ICPR3
2008 K-means clustering of proportional data using L1 distance
abstract
We present a new L1-distance-based k-means clustering algorithm to address the challenge of clustering high-dimensional proportional vectors. The new algorithm explicitly incorporates proportionality constraints in the computation of the cluster centroids, resulting in reduced L1 error rates. We compare the new method to two competing methods, an approximate L1-distance k-means algorithm, where the centroid is estimated using cluster means, and a median L1 k-means algorithm, where the centroid is estimated using cluster medians, with proportionality constraints imposed by normalization in a second step. Application to clustering of projects based on distribution of labor hours by skill illustrates the advantages of the new algorithm.
Hisashi Kashima, Jianying Hu, Bonnie K. Ray, Moninder Singh
ICPR3
2004 Automated Risk Assessment for Managing Software Projects
Bonnie K. Ray, Tim Klinger, R. Delmonico, Peter Santhanam
SEKE1
2004 Empirical evaluation of defect projection models for widely-deployed production software systems
abstract
Defect-occurrence projection is necessary for the development of methods to mitigate the risks of software defect occurrences. In this paper, we examine user-reported software defect-occurrence patterns across twenty-two releases of four widely-deployed, business-critical, production, software systems: a commercial operating system, a commercial middleware system, an open source operating system (OpenBSD), and an open source middleware system (Tomcat). We evaluate the suitability of common defect-occurrence models by first assessing the match between characteristics of widely-deployed production software systems and model structures. We then evaluate how well the models fit real world data. We find that the Weibull model is flexible enough to capture defectoccurrence behavior across a wide range of systems. It provides the best model fit in 16 out of the 22 releases. We then evaluate the ability of the moving averages and the exponential smoothing methods to extrapolate Weibull model parameters using fitted model parameters from historical releases. Our results show that in 50% of our forecasting experiments, these two naïve parameter-extrapolation methods produce projections that are worse than the projection from using the same model parameters as the most recent release. These findings establish the need for further research on parameter-extrapolation methods that take into account variations in characteristics of widely-deployed, production, software systems across multiple releases.
Paul Luo Li, Mary Shaw, James D. Herbsleb, Bonnie K. Ray, Peter Santhanam
SIGSOFT FSE4
1993 Software recreate problems estimated to range 10-20 percent: A case study on two operating system products
abstract
Software recreates are necessitated due to inadequate diagnostic capability following a failure. They impact the service process and the perception of availability, but have never been adequately quantified. This paper develops a technique to make the key measurements of: percent recreate, arrival rate and open time, from problem service data without requiring any additional instrumentation. The study is conducted over an 18 month period on two operating system products, that are among the best in the industry for diagnosis and service. The results provide the first insight into the problem and some accurate baselines.
Ram Chillarege, Bonnie K. Ray, Al Garrigan, Dave Ruth
ISSRE2
1992 Orthogonal Defect Classification - A Concept for In-Process Measurements
abstract
Orthogonal defect classification (ODC), a concept that enables in-process feedback to software developers by extracting signatures on the development process from defects, is described. The ideas are evolved from an earlier finding that demonstrates the use of semantic information from defects to extract cause-effect relationships in the development process. This finding is leveraged to develop a systematic framework for building measurement and analysis methods. The authors define ODC and discuss the necessary and sufficient conditions required to provide feedback to a developer; illustrate the use of the defect type distribution to measure the progress of a product through a process; illustrate the use of the defect trigger distribution to evaluate the effectiveness and eventually the completeness of verification processes such as inspection or testing; provides sample results from pilot projects using ODC; and open the doors to a wide variety of analysis techniques for providing effective and fast feedback based on the concepts of ODC.>
Ram Chillarege, Inderpal S. Bhandari, Jarir K. Chaar, Michael J. Halliday, Diane S. Moebus, Bonnie K. Ray, Man-Yuen Wong
IEEE Trans. Software Eng.6