Although CMOS feature size scaling has been the source of dramatic performance gains, it has lead to mounting reliability concerns due to increasing power densities and on-chip temperatures. Given that most wearout mechanisms that plague semiconductor devices are highly dependent on these parameters, significantly higher failure rates are projected for future technology generations. Traditional techniques for dealing with device failures have relied on coarse-grained redundancy to maintain service in the face of failed components. In this work, we challenge this practice by identifying its inability to scale to high failure rate scenarios and investigate the advantages of finer-grained configurations. We use this study to motivate the design of StageNet, an embedded CMP architecture designed from its inception with reliability as a first class design constraint. StageNet relies on a reconfigurable network of replicated processor pipeline stages to maximize the useful lifetime of the chip, gracefully degrading performance toward end of life. This paper addresses the microarchitecture of the basic building block of StageNet, named StageNetSlice, which is a processor core comprised of networked pipeline stages. A naive slice design results in approximately 4X slowdown verses a traditional processor due to longer communication delays in the pipeline. However, several small design changes that eliminate inter-stage communication paths and minimize communication bandwidth reduce this overhead to 11% on average while providing high levels of fine-grain adaptability.

Scaling of CMOS feature size has long been a source of dramatic performance gains. However, the reduction in voltage levels has not been able to match this rate of scaling, leading to increasing operating temperatures and current densities. Given that most wearout mechanisms that plague semiconductor devices are highly dependent on these parameters, significantly higher failure rates are projected for future technology generations. Consequently, high reliability and fault tolerance, which have traditionally been subjects of interest for high-end server markets, are now getting emphasis in the mainstream desktop and embedded systems space. The popular solution for this has been the use of redundancy at a coarse granularity, such as dual/triple modular redundancy. In this work, we challenge the practice of coarse-granularity redundancy by identifying its inability to scale to high failure rate scenarios and investigating the advantages of finer-grained configurations. To this end, this paper presents and evaluates a highly reconfigurable multicore architecture, named StageNet (SN), that is designed with reliability as its first class design criteria. SN relies on a reconfigurable network of replicated processor pipeline stages to maximize the useful lifetime of a chip, gracefully degrading performance towards the end of life. Our results show that the proposed SN architecture can perform nearly 50% more cumulative work compared to a traditional multicore.

Technology scaling, characterized by decreasing feature size, thinning gate oxide, and non-ideal voltage scaling, will become a major hindrance to microprocessor reliability in future technology generations. Physical analysis of device failure mechanisms has shown that most wearout mechanisms projected to plague future technology generations are progressive, meaning that the circuit-level effects of wearout develop and intensify with age over the lifetime of the chip. This work leverages the progression of wearout over time in order to present a low-cost hardware structure that identifies increasing propagation delay, which is symptomatic of many forms of wearout, to accurately forecast the failure of microarchitectural structures. To motivate the use of this predictive technique, an HSPICE analysis of the effects of one particular failure mechanism, gate oxide breakdown, on gates from a standard cell library characterized for a 90 nm process is presented. This gate-level analysis is then used to demonstrate the aggregate change in output delay of high-level structures within a synthesized Verilog model of an embedded microprocessor core. Leveraging this analysis, a self- calibrating hardware structure for conducting statistical analysis of output delay is presented and its efficacy in predicting the failure of a variety of structures within the microprocessor core is evaluated.

As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transient errors, and transistor wear-out. Unless these challenges are addressed, computer vendors can expect low yields and short mean-times-to-failure. In this article, we examine the challenges of designing complex computing systems in the presence of transient and permanent faults. We select one small aspect of a typical chip multiprocessor (CMP) system to study in detail, a single CMP router switch. Our goal is to design a BulletProof CMP switch architecture capable of tolerating significant levels of various types of defects. We first assess the vulnerability of the CMP switch to transient faults. To better understand the impact of these faults, we evaluate our CMP switch designs using circuit-level timing on detailed physical layouts. Our infrastructure represents a new level of fidelity in architectural-level fault analysis, as we can accurately track faults as they occur, noting whether they manifest or not, because of masking in the circuits, logic, or architecture. Our experimental results are quite illuminating. We find that transient faults, because of their fleeting nature, are of little concern for our CMP switch, even within large switch fabrics with fast clocks. Next, we develop a unified model of permanent faults, based on the time-tested bathtub curve. Using this convenient abstraction, we analyze the reliability versus area tradeoff across a wide spectrum of CMP switch designs, ranging from unprotected designs to fully protected designs with on-line repair and recovery capabilities. Protection is considered at multiple levels from the entire system down through arbitrary partitions of the design. We find that designs are attainable that can tolerate a larger number of defects with less overhead than naïve triple-modular redundancy, using domain-specific techniques, such as end-to-end error detection, resource sparing, automatic circuit decomposition, and iterative diagnosis and reconfiguration.

Device scaling trends dramatically increase the susceptibility of microprocessors to soft errors. Further, mounting demand for embedded microprocessors in a wide array of safety critical applications, ranging from automobiles to pacemakers, compounds the importance of addressing the soft error problem. Historically, soft error tolerance techniques have been targeted mainly at high-end server markets, leading to solutions such as coarse-grained modular redundancy and redundant multithreading. However, these techniques tend to be prohibitively expensive to implement in the embedded design space. To address this problem, we first present a thorough analysis of the effects of soft errors on a production-grade, fully synthesized implementation of an ARM926EJ-S embedded microprocessor. We then leverage this analysis in the design of two orthogonal low-costs of terror protection techniques that can be tuned to achieve variable levels of fault coverage as a function of area and power constraints. The first technique uses a small cache of live register values in order to provide nearly twice the fault coverage of a register file protected using traditional error correcting codes at little or no additional area cost. The second technique is a statistical method used to significantly reduce the overhead of deploying time-delayed shadow latches for low-latency fault detection.

As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transient errors, and transistor wear-out. Unless these challenges are addressed, computer vendors can expect low yields and short mean-times-to-failure. In this paper, we examine the challenges of designing complex computing systems in the presence of transient and permanent faults. We select one small aspect of a typical chip multiprocessor (CMP) system to study in detail, a single CMP router switch. To start, we develop a unified model of faults, based on the time-tested bathtub curve. Using this convenient abstraction, we analyze the reliability versus area tradeoff across a wide spectrum of CMP switch designs, ranging from unprotected designs to fully protected designs with online repair and recovery capabilities. Protection is considered at multiple levels from the entire system down through arbitrary partitions of the design. To better understand the impact of these faults, we evaluate our CMP switch designs using circuit-level timing on detailed physical layouts. Our experimental results are quite illuminating. We find that designs are attainable that can tolerate a larger number of defects with less overhead than naive triple-modular redundancy, using domain-specific techniques such as end-to-end error detection, resource sparing, automatic circuit decomposition, and iterative diagnosis and reconfiguration.

In digital hardware system design, the quality of the product is directly related to the number of meaningful design alternatives properly considered. Unfortunately, existing modeling methodologies and tools have properties which make them less than ideal for rapid and accurate design-space exploration. This article identifies and evaluates the shortcomings of existing methods to motivate the Liberty Simulation Environment (LSE). LSE is a high-level modeling tool engineered to address these limitations, allowing for the rapid construction of accurate high-level simulation models. LSE simplifies model specification with low-overhead component-based reuse techniques and an abstraction for timing control. As part of a detailed description of LSE, this article presents these features, their impact on model specification effort, their implementation, and optimizations created to mitigate their otherwise deleterious impact on simulator execution performance.

Instruction set customization is an effective way to improve processor performance. Critical portions of application data-flow graphs are collapsed for accelerated execution on specialized hardware. Collapsing dataflow subgraphs will compress the latency along critical paths and reduces the number of intermediate results stored in the register file. While custom instructions can be effective, the time and cost of designing a new processor for each application is immense. To overcome this roadblock, this paper proposes a flexible architectural framework to transparently integrate custom instructions into a general-purpose processor. Hardware accelerators are added to the processor to execute the collapsed subgraphs. A simple microarchitectural interface is provided to support a plug-and-play model for integrating a wide range of accelerators into a pre-designed and verified processor core. The accelerators are exploited using an approach of static identification and dynamic realization. The compiler is responsible for identifying profitable subgraphs, while the hardware handles discovery, mapping, and execution of compatible subgraphs. This paper presents the design of a plug-and-play transparent accelerator system arid evaluates the cost/performance implications of the design.

Even as modern computing systems allow the manipulation and distribution of massive amounts of information, users of these systems are unable to manage the confidentiality of their data in a practical fashion. Conventional access control security mechanisms cannot prevent the illegitimate use of privileged data once access is granted. For example, information provided by a user during an online purchase may be covertly delivered to malicious third parties by an untrustworthy web browser. Existing information-flow security mechanisms do provide this assurance, but only for programmer-specified policies enforced during program development as a static analysis on special-purpose type-safe languages. Not only are these techniques not applicable to many commonly used programs, but they leave the user with no defense against malicious programmers or altered binaries. In this paper, we propose RIFLE, a runtime information-flow security system designed from the user's perspective. By addressing information-flow security using architectural support, RIFLE gives users a practical way to enforce their own information-flow security policy on all programs. We prove that, contrary to statements in the literature, run-time systems like RIFLE are no less secure than existing language-based techniques. Using a model of the architectural framework and a binary translator, we demonstrate RIFLE's correctness and illustrate that the performance cost is reasonable.

To find the best designs, architects must rapidly simulate many design alternatives and have confidence in the results. Unfortunately, the most prevalent simulator construction methodology, hand-writing monolithic simulators in sequential programming languages, yields simulators that are hard to retarget, limiting the number of designs explored, and hard to understand, instilling little confidence in the model. Simulator construction tools have been developed to address these problems, but analysis reveals that they do not address the root cause, the error-prone mapping between the concurrent, structural hardware domain and the sequential, functional software domain. This paper presents an analysis of these problems and their solution, the Liberty Simulation Environment (LSE). LSE automatically constructs a simulator from a machine description that closely resembles the hardware, ensuring fidelity in the model. Furthermore, through a strict but general component communication contract, LSE enables the creation of highly reusable component libraries, easing the task of rapidly exploring ever more exotic designs.