Area efficient self-correcting flip-flops for use with triple modular redundant (TMR) soft-error hardened logic are implemented in a 12-nm finFET process technology. The TMR flip-flop slave latches self-correct in the clock low phase using Muller C-elements in the latch feedback. These C-elements are driven by the two redundant stored values and not by the slave latch itself, saving area over a similar implementation using majority gate feedback. These flip-flops are implemented as large shift-register arrays on a test chip and have been experimentally tested for their soft-error mitigation in static and dynamic modes of operation using heavy ions and protons. We show how high clock skew can result in susceptibility to soft-errors in the dynamic mode, and explain the potential failure mechanism.

Spike timing dependent plasticity (STDP) is an important neural process that enables biological neural networks to learn by strengthening or weakening synaptic connections between neurons. This work presents simulation results and post-silicon experimental data that demonstrate for the first time the possibility of tuning the on state resistance of a type of emerging resistive memory device known as conductive bridge random access memory (CBRAM) in accordance with the biological STDP rule for neuromorphic applications. STDP behavior is demonstrated for CBRAM devices integrated with CMOS spiking neuron circuitry through back end of line post-processing for different initial resistance values and spike durations.

In this paper, we present a review of the state of the art in memristor technologies. Along with ionic conducting devices [i.e., conductive bridging random access memory (CBRAM)], we include phase change, and organic/organo-metallic technologies, and we review the most recent advances in oxide-based memristor technologies. We present progress on 3-D integration techniques, and we discuss the behavior of more mature memristive technologies in extreme environments.