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James A. Hutchby

dblp:69/5831 · DBLP profile ↗
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4ranked-venue papers
0as first author
0since 2021 · last 2010
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Applied, interdisciplinary, general and emerging computing · 4

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
3 papers
Emerging computing paradigms · 42% Interconnection networks and networks-on-chip · 26% Integrated circuit design · 18%

Topics — the 7 heaviest of 10, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Emerging computing paradigms
beyond-CMOS computing
0.112010
Nanoelectronics Research for Beyond CMOS Information Processing · Proc. IEEE 2010
Processor architecture and microarchitecture › general-purpose processor architecture
von neumann architecture
0.012003
Limits to binary logic switch scaling - a gedanken model · Proc. IEEE 2003
Integrated circuit design › technology scaling
CMOS scaling
0.012010
Nanoelectronics Research for Beyond CMOS Information Processing · Proc. IEEE 2010
Integrated circuit design
interconnect
0.012001
High-performance interconnects: an integration overview · Proc. IEEE 2001
Interconnection networks and networks-on-chip
on-chip interconnect
0.012001
High-performance interconnects: an integration overview · Proc. IEEE 2001
Interconnection networks and networks-on-chip
optical interconnection networks
0.012001
High-performance interconnects: an integration overview · Proc. IEEE 2001
Interconnection networks and networks-on-chip › on-chip interconnect
RF-interconnect
0.012001
High-performance interconnects: an integration overview · Proc. IEEE 2001

Methods — techniques the papers use, named apart from their topics

gedanken model · 0.0
YearPublicationVenuePosition
2010 Nanoelectronics Research for Beyond CMOS Information Processing
abstract
This special issue presents a variety of invited papers covering nanostructures and related materials proposed to extend CMOS scaling to its ultimate limit and enable a variety of new logic and memory devices.
George Bourianoff, Michel Brillouët, Ralph K. Cavin III, Toshiro Hiramoto, James A. Hutchby, Adrian M. Ionescu, Ken Uchida
Proc. IEEE5
2010 Regional, National, and International Nanoelectronics Research Programs: Topical Concentration and Gaps
abstract
This paper will outline some results obtained by an international working group on nanoelectronics, which collects data from major publicly funded programs in Europe, Japan, and the United States on long-term nanoelectronics research. It maps these programs and projects onto a set of research directions that are expected to drive nanoelectronics for the long term. The purpose is to identify those research topics attracting a lot of attention and those important topics that seem less attractive. This paper will give examples of interregional collaborative programs and identify sources of funding specifically provided to support international collaborations.
Michel Brillouët, George Bourianoff, Ralph K. Cavin III, Toshiro Hiramoto, James A. Hutchby, Adrian M. Ionescu, Ken Uchida
Proc. IEEE5
2003 Limits to binary logic switch scaling - a gedanken model
abstract
In this paper we consider device scaling and speed limitations on irreversible von Neumann computing that are derived from the requirement of "least energy computation." We consider computational systems whose material realizations utilize electrons and energy barriers to represent and manipulate their binary representations of state.
Victor V. Zhirnov, Ralph K. Cavin III, James A. Hutchby, George Bourianoff
Proc. IEEE3
2001 High-performance interconnects: an integration overview
abstract
The Information Revolution and enabling era of silicon ultralarge-scale integration (ULSI) have spawned an ever-increasing level of functional integration on-chip, driving a need for greater circuit density and higher performance. While traditional transistor scaling has thus far met this challenge, interconnect scaling has become the performance-limiting factor for new designs. The increasing influence of interconnect parasitics on crosstalk noise and R(L)C delay as well as electromigration and power dissipation concerns have stimulated the introduction of low-resistivity copper and low-permittivity (k) dielectrics to provide performance and reliability enhancement. Integration of these new materials into integrated circuit fabrication is a formidable task, requiring material, process, design, and packaging innovations. Additionally, entirely new technologies such as RF and optical interconnects may be required to address future global routing needs and sustain performance improvement.
Robert H. Havemann, James A. Hutchby
Proc. IEEE2