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Yaov Yadin

dblp:70/5055 · DBLP profile ↗
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1ranked-venue papers
0as first author
0since 2021 · last 1999
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Electronic design automation · 87% Processor architecture and microarchitecture · 13%

Topics — the 3 heaviest of 3, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation
hardware verification and test
0.011999
Micro Architecture Coverage Directed Generation of Test Programs · DAC 1999
Electronic design automation › hardware verification and test › test generation › test case generation
test program generation
0.011999
Micro Architecture Coverage Directed Generation of Test Programs · DAC 1999
Processor architecture and microarchitecture
superscalar processor
0.011999
Micro Architecture Coverage Directed Generation of Test Programs · DAC 1999

Methods — techniques the papers use, named apart from their topics

cycle-accurate modeling · 0.0coverage directed generation · 0.0
YearPublicationVenuePosition
1999 Micro Architecture Coverage Directed Generation of Test Programs
abstract
In this paper, we demonstrate a method for generation of assembler test programs that systematically probe the micro architecture of a PowerPC superscalar processor.We show innovations such as ways to make small models for large designs, predict, with cycle accuracy the movement of instructions through the pipes (taking into account stalls and dependencies) and generation of test programs such that each reaches a new micro architectural state.We compare our method to the established practice of massive random generation and show that the quality of our tests, as measured by transition coverage, is much higher.The main contribution of this paper is not in theory, as the theory has been discussed in previous papers, but in describing how to translate this theory into practice in a practical way, a task that was far from trivial.
Shmuel Ur, Yaov Yadin
DAC2