Albert M. Young

dblp:71/4880 · DBLP profile ↗
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1ranked-venue papers
0as first author
0since 2021 · last 2007
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Integrated circuit design · 39% Interconnection networks and networks-on-chip · 30% Electronic design automation · 30%

Topics — the 4 heaviest of 4, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Interconnection networks and networks-on-chip › die-to-die interconnect
3d interconnect
0.112007
Interconnects in the Third Dimension: Design Challenges for 3D ICs · DAC 2007
Electronic design automation
physical design
0.112007
Interconnects in the Third Dimension: Design Challenges for 3D ICs · DAC 2007
Integrated circuit design › 3d integration
through-silicon via
0.112007
Interconnects in the Third Dimension: Design Challenges for 3D ICs · DAC 2007
Integrated circuit design
3d integration
0.012007
Interconnects in the Third Dimension: Design Challenges for 3D ICs · DAC 2007
YearPublicationVenuePosition
2007 Interconnects in the Third Dimension: Design Challenges for 3D ICs
abstract
Despite generation upon generation of scaling, computer chips have until now remained essentially 2-dimensional. Improvements in on-chip wire delay and in the maximum number of I/O per chip have not been able to keep up with transistor performance growth; it has become steadily harder to hide the discrepancy. 3D chip technologies come in a number of flavors, but are expected to enable the extension of CMOS performance. Designing in three dimensions, however, forces the industry to look at formerly-two- dimensional integration issues quite differently, and requires the re-fitting of multiple existing EDA capabilities.
Kerry Bernstein, Paul S. Andry, Jerome Cann, Philip G. Emma, David Greenberg, Wilfried Haensch, Mike Ignatowski, Steven J. Koester, John Magerlein, Ruchir Puri, Albert M. Young
DAC11