Demo Data from VLDB 2026 / reviewers in the wild / expert
Ying W. Ng
dblp:74/245
· DBLP profile ↗
3ranked-venue papers
2as first author
0since 2021 · last 1981
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 3 · 2 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
2 papers |
Hardware reliability and fault tolerance · 71% Electronic design automation · 23% Processor architecture and microarchitecture · 7% |
Topics — the 6 heaviest of 7, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation › CAD framework
design tool integration |
0.0 | 1 | 1981 | AIDE - a tool for computer architecture design · DAC 1981 |
Hardware reliability and fault tolerance › fault-tolerant architecture
fault-tolerant computer |
0.0 | 1 | 1980 | A Unified Reliability Model for Ault-Tolerant Computers · IEEE Trans. Computers 1980 |
Hardware reliability and fault tolerance
reliability analysis |
0.0 | 1 | 1980 | A Unified Reliability Model for Ault-Tolerant Computers · IEEE Trans. Computers 1980 |
Hardware reliability and fault tolerance
reliability modeling |
0.0 | 1 | 1980 | A Unified Reliability Model for Ault-Tolerant Computers · IEEE Trans. Computers 1980 |
Hardware reliability and fault tolerance
permanent fault |
0.0 | 1 | 1980 | A Unified Reliability Model for Ault-Tolerant Computers · IEEE Trans. Computers 1980 |
Hardware reliability and fault tolerance › soft errors
transient fault |
0.0 | 1 | 1980 | A Unified Reliability Model for Ault-Tolerant Computers · IEEE Trans. Computers 1980 |
Methods — techniques the papers use, named apart from their topics
computer-aided design · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1981 | AIDE - a tool for computer architecture design
D. J. Ellenberger, Ying W. Ng |
DAC | 2 |
| 1980 | A Unified Reliability Model for Ault-Tolerant ComputersabstractThe diversified nature of fault-tolerant computers led to the development of a multiplicity of reliability models which are seemingly unrelated to each other. As a result, it becomes difficult to develop automated tools for reliability analysis which are both general and efficient. Thus, the potential of reliability modeling as a practical and useful tool in the design process of fault-tolerant computers has not been fully realized. This paper summarizes the results of an extended effort to develop a unified approach to reliability modeling of fault-tolerant computers which strikes a good compromise between generality and practicality. The unified model developed encompasses repairable and nonrepairable systems and models, transient as well as permanent faults, and their recovery. Based on the unified model, a powerful and efficient reliability estimation program ARIES has been developed. Ying W. Ng, Algirdas Avizienis |
IEEE Trans. Computers | 1 |
| 1976 | Comments on "Fault Folding for Irredundant and Redundant Combinational Circuits"
Ying W. Ng, Algirdas Avizienis |
IEEE Trans. Computers | 1 |