Silent Data Corruption (SDC) is a serious reliability issue in many domains, including embedded systems. However, current protection techniques are brittle and do not allow programmers to trade off performance for SDC coverage. Further, many require tens of thousands of fault-injection experiments, which are highly time- and resource-intensive. In this article, we propose two empirical models, SDCTune and SDCAuto , to predict the SDC proneness of a program’s data. Both models are based on static and dynamic features of the program alone and do not require fault injections to be performed. The main difference between them is that SDCTune requires manual tuning while SDCAuto is completely automated, using machine-learning algorithms. We then develop an algorithm using both models to selectively protect the most SDC-prone data in the program subject to a given performance overhead bound. Our results show that both models are accurate at predicting the relative SDC rate of an application compared to fault injection, for a fraction of the time taken. Further, in terms of efficiency of detection (i.e., ratio of SDC coverage provided to performance overhead), our technique outperforms full duplication by a factor of 0.78x to 1.65x with the SDCTune model and 0.62x to 0.96x with SDCAuto model.

Silent Data Corruption (SDC) is a serious reliability issue in many domains, including embedded systems. However, current protection techniques are brittle, and do not allow programmers to trade off performance for SDC coverage. Further, many of them require tens of thousands of fault injection experiments, which are highly time-intensive. In this paper, we propose an empirical model to predict the SDC proneness of a program's data called SDCTune. SDCTune is based on static and dynamic features of the program alone, and does not require fault injections to be performed. We then develop an algorithm using SDCTune to selectively protect the most SDC-prone data in the program subject to a given performance overhead bound. Our results show that our technique is highly accurate at predicting the relative SDC rate of an application, and outperforms full duplication by a factor of 0.83 to 1.87x in efficiency of detection (i.e., ratio of SDC coverage provided to performance overhead).

Voltage noise is a major obstacle in improving processor energy efficiency because it necessitates large operating voltage guardbands that increase overall power consumption and limit peak performance. Identifying the leading root causes of voltage noise is essential to minimize the unnecessary guardband and maximize the overall energy efficiency. We provide the first-ever modeling and characterization of voltage noise in GPUs based on a new simulation infrastructure called GPUVolt. Using it, we identify the key intracore microarchitectural components (e.g., the register file and special functional units) that significantly impact the GPU's voltage noise. We also demonstrate that intercore-aligned microarchitectural activity detrimentally impacts the chip- wide worst-case voltage droops. On the basis of these findings, we propose a combined register-file and execution-unit throttling mechanism that smooths GPU voltage noise and reduces the guardband requirement by as much as 29%.

Soft Error Resiliency is a major concern for Petascale high performance computing (HPC) systems. Blue Gene/Q (BG/Q) is the third generation of IBM's massively parallel, energy efficient Blue Gene series of supercomputers. The principal goal of this work is to understand the interaction between Blue-Gene/Q's hardware resiliency features and high-performance applications through proton irradiation of a real chip, and software resiliency inherent in these applications through application-level fault injection (AFI) experiments. From the proton irradiation experiments we derived that the mean time between correctable errors at sea level of the SRAM-based register files and Level-1 caches for a system similar to the scale of Sequoia system. From the AFI experiments, we characterized relative vulnerability among the applications in both general purpose and floating point register files. We categorized and quantified the failure outcomes, and discovered characteristics in the applications that lead to many masking improvement opportunities.

Modern processor systems are equipped with on-chip or on-board power controllers. In this paper, we examine the challenges and pitfalls in architecting such dynamic power management control systems. A key question that we pose is: How to ensure that such managed systems are “energy-secure” and how to pursue pre-silicon modeling to ensure such security? In other words, we address the robustness and security issues of such systems. We discuss new advances in energy-secure power management, starting with an assessment of potential vulnerabilities in systems that do not address such issues up front.

Microprocessor-based systems today are composed of multi-core, multi-threaded processors with complex cache hierarchies and gigabytes of main memory. Accurate characterization of such a system, through predictive pre-silicon modeling and/or diagnostic post silicon measurement based analysis are increasingly cumbersome and error prone. This is especially true of energy-related characterization studies. In this paper, we take the position that automated micro-benchmarks generated with particular objectives in mind hold the key to obtaining accurate energy-related characterization. As such, we first present a flexible micro-benchmark generation framework (MicroProbe) that is used to probe complex multi-core/multithreaded systems with a variety and range of energy-related queries in mind. We then present experimental results centered around an IBM POWER7 CMP/SMT system to demonstrate how the systematically generated micro-benchmarks can be used to answer three specific queries: (a) How to project application-specific (and if needed, phase-specific) power consumption with component-wise breakdowns? (b) How to measure energy-per-instruction (EPI) values for the target machine? (c) How to bound the worst-case (maximum) power consumption in order to determine safe, but practical (i.e. affordable) packaging or cooling solutions? The solution approaches to the above problems are all new. Hardware measurement based analysis shows superior power projection accuracy (with error margins of less than 2.3% across SPEC CPU2006) as well as maxpower stressing capability (with 10.7% increase in processor power over the very worst-case power seen during the execution of SPEC CPU2006 applications).

This paper provides: 1) a very brief motivation and technological trend data to show why hard and soft errors are expected to be of increasing concern in the future; 2) a summary review of chip-level error tolerance practices today-with a brief reference to IBM's POWER6 and POWER7 designs; 3) open research challenges and current solution approaches of promise, based on published literature; and 4) concluding remarks.

Next generation system designs are challenged by multiple "walls": among them, the inter-related impediments offered by power dissipation limits and reliability are particularly difficult ones that all current chip/system design teams are grappling with. In this paper, we first describe the attendant challenges in integrated (multi-dimensional) pre-silicon modeling and the solution approaches being pursued. Later, we focus on leading edge solutions for power, thermal and failure-rate mitigation that have been proposed in our R&D work over the past decade.

In recent years, circuit reliability in modern high-performance processors has become increasingly important. Shrinking feature sizes and diminishing supply voltages have made circuits more sensitive to microprocessor supply voltage fluctuations. These fluctuations result from the natural variation of processor activity as workloads execute, but when left unattended, these voltage fluctuations can lead to timing violations or even transistor lifetime issues. In this article, we present a hardware--software collaborative approach to mitigate voltage fluctuations. A checkpoint-recovery mechanism rectifies errors when voltage violates maximum tolerance settings, while a runtime software layer reschedules the program's instruction stream to prevent recurring violations at the same program location. The runtime layer, combined with the proposed code-rescheduling algorithm, removes 60% of all violations with minimal overhead, thereby significantly improving overall performance. Our solution is a radical departure from the ongoing industry-standard approach to circumvent the issue altogether by optimizing for the worst-case voltage flux, which compromises power and performance efficiency severely, especially looking ahead to future technology generations. Existing conservative approaches will have severe implications on the ability to deliver efficient microprocessors. The proposed technique reassembles a traditional reliability problem as a runtime performance optimization problem, thus allowing us to design processors for typical case operation by building intelligent algorithms that can prevent recurring violations.

Power constrained designs are becoming increasingly sensitive to supply voltage noise. We propose a hardware-software collaborative approach to enable aggressive operating margins: a checkpoint-recovery mechanism corrects margin violations, while a run-time software layer reschedules the program's instruction stream to prevent recurring margin crossings at the same program location. The run-time layer removes 60% of these events with minimal overhead, thereby significantly improving overall performance.

Supply voltage fluctuations that result from inductive noise are increasingly troublesome in modern microprocessors. A voltage ldquoemergencyrdquo, i.e., a swing beyond tolerable operating margins, jeopardizes the safe and correct operation of the processor. Techniques aimed at reducing power consumption, e.g., by clock gating or by reducing nominal supply voltage, exacerbate this noise problem, requiring ever-wider operating margins. We propose an event-guided, adaptive method for avoiding voltage emergencies, which exploits the fact that most emergencies are correlated with unique microarchitectural events, such as cache misses or the pipeline flushes that follow branch mispredictions. Using checkpoint and rollback to handle unavoidable emergencies, our method adapts dynamically by learning to trigger avoidance mechanisms when emergency-prone events recur. After tightening supply voltage margins to increase clock frequency and accounting for all costs, the net result is a performance improvement of 8% across a suite of fifteen SPEC CPU2000 benchmarks.

Inductive noise forces microprocessor designers to sacrifice performance in order to ensure correct and reliable operation of their designs. The possibility of wide fluctuations in supply voltage means that timing margins throughout the processor must be set pessimistically to protect against worst-case droops and surges. While sensor-based reactive schemes have been proposed to deal with voltage noise, inherent sensor delays limit their effectiveness. Instead, this paper describes a voltage emergency predictor that learns the signatures of voltage emergencies (the combinations of control flow and microarchitectural events leading up to them) and uses these signatures to prevent recurrence of the corresponding emergencies. In simulations of a representative superscalar microprocessor in which fluctuations beyond 4% of nominal voltage are treated as emergencies (an aggressive configuration), these signatures can pinpoint the likelihood of an emergency some 16 cycles ahead of time with 90% accuracy. This lead time allows machines to operate with much tighter voltage margins (4% instead of 13%) and up to 13.5% higher performance, which closely approaches the 14.2% performance improvement possible with an ideal oracle-based predictor.

With continued advances in CMOS technology, parameter variations are emerging as a major design challenge. Irregularities during the fabrication of a microprocessor and variations of voltage and temperature during its operation widen worst-case timing margins of the design—degrading performance significantly. Because runtime variations like supply voltage droops and temperature fluctuations depend on the activity signature of the processor's workload, there are several opportunities to improve performance by dynamically adapting margins. This paper explores the power-performance efficiency gains that result from designing for typical conditions while dynamically tuning frequency and voltage to accommodate the runtime behavior of workloads. Such a design depends on a fail-safe mechanism that allows it to protect against margin violations during adaptation; we evaluate several such mechanisms, and we propose a local recovery scheme that exploits spatial variation among the units of the processor. While a processor designed for worst-case conditions might only be capable of a frequency that is 75% of an ideal processor with no parameter variations, we show that a fine-grained global frequency tuning mechanism improves power-performance efficiency (BIPS3/W) by 40% while operating at 91% of an ideal processor's frequency. Moreover, a per-unit voltage tuning mechanism aims to reduce the effect of within-die spatial variations to provide a 55% increase in power-performance efficiency. The benefits reported are clearly substantial in light of the ≪1% area overhead relative to existing global recovery mechanisms.

Increases in peak current draw and reductions in the operating voltage of processors stress the importance of dealing with voltage fluctuations in processors. Noise-margin violations lead to undesired effects, like timing violations, which may result in incorrect execution of applications. Several recent architectural solutions for inductive noise have been proposed that, unfortunately, have a strong correlation to the underlying power-delivery package model and require a feedback loop that is largely constrained by the voltage/current sensor characteristics. The resulting solutions are not robust across a wide range of microprocessor designs and packaging technologies. This paper proposes a Delayed-commit and rollback scheme (DeCoR) that guarantees correctness, insensitive to the package model or the responsiveness of the voltage sensors. In particular, our approach recovers from, rather than attempting to avoid, voltage emergencies. This approach incurs a small performance penalty when compared to an ideal machine that does not have voltage emergencies. We show that explicit checkpoint-recovery schemes, intended to handle infrequent events, e.g., radiation-induced soft errors, suffer from large performance overheads for frequently-occurring voltage emergencies. DeCoR requires very few modifications to modern processor designs, as it leverages the existing store queue and reorder buffers. Unlike conventional designs that conservatively protect all components of the processor from inductive noise with overly-large timing margins, our approach only requires conservative protection of the architected register state and cache write paths.

Portable, embedded systems place ever-increasing demands on high-performance, low-power microprocessor design. Dynamic voltage and frequency scaling (DVFS) is a well-known technique to reduce energy in digital systems, but the effectiveness of DVFS is hampered by slow voltage transitions that occur on the order of tens of microseconds. In addition, the recent trend towards chip-multiprocessors (CMP) executing multi-threaded workloads with heterogeneous behavior motivates the need for per-core DVFS control mechanisms. Voltage regulators that are integrated onto the same chip as the microprocessor core provide the benefit of both nanosecond-scale voltage switching and per-core voltage control. We show that these characteristics provide significant energy-saving opportunities compared to traditional off-chip regulators. However, the implementation of on-chip regulators presents many challenges including regulator efficiency and output voltage transient characteristics, which are significantly impacted by the system-level application of the regulator. In this paper, we describe and model these costs, and perform a comprehensive analysis of a CMP system with on-chip integrated regulators. We conclude that on-chip regulators can significantly improve DVFS effectiveness and lead to overall system energy savings in a CMP, but architects must carefully account for overheads and costs when designing next-generation DVFS systems and algorithms.

Recent efforts to address microprocessor power dissipation through aggressive supply voltage scaling and power management require that designers be increasingly cognizant of power supply variations. These variations, primarily due to fast changes in supply current, can be attributed to architectural gating events that reduce power dissipation. In order to study this problem, the authors propose a fine-grain, parameterizable model for power-delivery networks that allows system designers to study localized, on-chip supply fluctuations in high-performance microprocessors. Using this model, the authors analyze voltage variations in the context of next-generation chip-multiprocessor (CMP) architectures using both real applications and synthetic current traces. They find that the activity of distinct cores in CMPs present several new design challenges when considering power supply noise, and they describe potentially problematic activity sequences that are unique to CMP architectures

Increases in peak current draw and reductions in the operating voltages ofprocessors continue to amplify the importance of dealing with voltage fluctuations in processors. One approach suggested has been to not only react to these fluctuations but also attempt to eliminate future occurrences of these fluctuations by dynamically modifying the executing program. This paper investigates the potential of a very simple dynamic scheme to appreciably reduce the number of run-time voltage emergencies. It shows that we can map many of the voltage emergencies in the execution of the SPEC benchmarks on an aggressive superscalar design to a few static loops, categorize the microarchitectural cause of the emergencies in each important loop through simple observations and a simple priority function, and finally apply straight forward software optimization strategies to mitigate up to 70% of the future voltage swings.

Given the scale of massively parallel systems, occurrence of faults is no longer an exception but a regular event. Periodic checkpointing is becoming increasingly important in these systems. However, huge memory footprints of parallel applications place severe limitations on scalability of normal checkpointing techniques. Incremental checkpointing is a well researched technique that addresses scalability concerns, but most of the implementations require paging support from hardware and the underlying operating system, which may not be always available. In this paper, we propose a software based adaptive incremental checkpoint technique which uses a secure hash function to uniquely identify changed blocks in memory. Our algorithm is the first self-optimizing algorithm that dynamically computes the optimal block boundaries, based on the history of changed blocks. This provides better opportunities for minimizing checkpoint file size. Since the hash is computed in software, we do not need any system support for this. We have implemented and tested this mechanism on the BlueGene/L system. Our results on several well-known benchmarks are encouraging, both in terms of reduction in average checkpoint file size and adaptivity towards application’s memory access patterns.