Demo Data from VLDB 2026 / reviewers in the wild / expert
Michael Peercy
dblp:76/75
· DBLP profile ↗
2ranked-venue papers
1as first author
0since 2021 · last 1994
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1Applied, interdisciplinary, general and emerging computing · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
2 papers |
Hardware reliability and fault tolerance · 72% Interconnection networks and networks-on-chip · 11% Electronic design automation · 10% |
Topics — the 9 heaviest of 11, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Hardware reliability and fault tolerance
reconfiguration |
0.0 | 2 | 1994 | Design and Evaluation of Hardware Strategies for Reconfiguring Hypercubes and Meshes Under Faults · IEEE Trans. Computers 1994 Fault tolerant VLSI systems · Proc. IEEE 1993 |
Hardware reliability and fault tolerance › network fault tolerance
fault-tolerant embedding |
0.0 | 1 | 1994 | Design and Evaluation of Hardware Strategies for Reconfiguring Hypercubes and Meshes Under Faults · IEEE Trans. Computers 1994 |
Interconnection networks and networks-on-chip › network topology › static interconnection networks
mesh and hypercube topology |
0.0 | 1 | 1994 | Design and Evaluation of Hardware Strategies for Reconfiguring Hypercubes and Meshes Under Faults · IEEE Trans. Computers 1994 |
Hardware reliability and fault tolerance › software fault tolerance
algorithm-based fault tolerance |
0.0 | 1 | 1993 | Fault tolerant VLSI systems · Proc. IEEE 1993 |
Hardware reliability and fault tolerance
error recovery |
0.0 | 1 | 1993 | Fault tolerant VLSI systems · Proc. IEEE 1993 |
Electronic design automation › hardware verification and test
fault detection |
0.0 | 1 | 1993 | Fault tolerant VLSI systems · Proc. IEEE 1993 |
Hardware reliability and fault tolerance › fault-tolerant architecture
fault-tolerant VLSI |
0.0 | 1 | 1993 | Fault tolerant VLSI systems · Proc. IEEE 1993 |
Hardware reliability and fault tolerance
redundancy |
0.0 | 1 | 1993 | Fault tolerant VLSI systems · Proc. IEEE 1993 |
Parallel and multicore computing
multicomputer |
0.0 | 1 | 1994 | Design and Evaluation of Hardware Strategies for Reconfiguring Hypercubes and Meshes Under Faults · IEEE Trans. Computers 1994 |
Methods — techniques the papers use, named apart from their topics
trace-driven simulation · 0.0time redundancy · 0.0space redundancy · 0.0information redundancy · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1994 | Design and Evaluation of Hardware Strategies for Reconfiguring Hypercubes and Meshes Under FaultsabstractThis paper discusses the design of two reconfiguration strategies for distributed memory multicomputer architectures under failures. The specific architectures to which we apply the techniques are hypercubes and meshes. The first scheme uses spare processors attached to certain processors in the hypercube or mash using a novel embedding technique. The second approach places spare processors along specific links in the hypercube or mesh. Both schemes involve the mapping of logical links of a virtual machine onto a set of physical links in the final reconfigured machine and hence suffer some performance degradation. We characterize the performance degradation through trace-driven simulation of real applications running on the faulty and reconfigured system. We find that the schemes have high reliability, suffer little degradation in performance, and are very low in cost.> Prithviraj Banerjee, Michael Peercy |
IEEE Trans. Computers | 2 |
| 1993 | Fault tolerant VLSI systemsabstractA wide variety of fault tolerance techniques for VLSI technology are examined. Device-, gate-, and function-levels fault models are described. The basic methods available to the designer of fault tolerance measures are introduced by surveying redundancy techniques. Techniques of fault detection that use space, time, and information redundancies, algorithm-based fault tolerance, in VLSI components, large-scale processor-level implementations of fault detection, fault tolerance in automated VLSI production systems are discussed. Reconfiguration of the system and recovery of system operation are described. Issues relating to the reconfiguration after discovery of a fault in fabrication or in operation are discussed. Recovery capabilities of a VLSI microprocessor are reviewed.> Michael Peercy, Prithviraj Banerjee |
Proc. IEEE | 1 |