Demo Data from VLDB 2026 / reviewers in the wild / expert
Koustav Bhattacharya
dblp:78/3038
· DBLP profile ↗
10ranked-venue papers
6as first author
0since 2021 · last 2011
0009-0007-6366-3927ORCID · corroborated
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 9 · 6 first-authorGraphics, computer vision, multimedia, augmented reality and games · 1Applied, interdisciplinary, general and emerging computing · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Hardware reliability and fault tolerance · 61% Processor architecture and microarchitecture · 34% Distributed systems · 5% | |
| Artificial intelligence
1 paper |
Face, body and person analysis · 100% | |
| Computer graphics and multimedia
1 paper |
Multimedia analysis and retrieval · 100% |
Topics — the 10 heaviest of 10, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Processor architecture and microarchitecture
chip multiprocessor |
0.1 | 1 | 2011 | Redundancy Mining for Soft Error Detection in Multicore Processors · IEEE Trans. Computers 2011 |
Processor architecture and microarchitecture › multiprocessor architecture
interprocessor communication reduction |
0.1 | 1 | 2011 | Redundancy Mining for Soft Error Detection in Multicore Processors · IEEE Trans. Computers 2011 |
Hardware reliability and fault tolerance › redundancy
redundant multithreading |
0.1 | 1 | 2011 | Redundancy Mining for Soft Error Detection in Multicore Processors · IEEE Trans. Computers 2011 |
Hardware reliability and fault tolerance
soft errors |
0.1 | 1 | 2011 | Redundancy Mining for Soft Error Detection in Multicore Processors · IEEE Trans. Computers 2011 |
Hardware reliability and fault tolerance › soft errors
soft error detection |
0.1 | 1 | 2011 | Redundancy Mining for Soft Error Detection in Multicore Processors · IEEE Trans. Computers 2011 |
Computer vision › Face, body and person analysis › face recognition
face retrieval |
0.1 | 1 | 2006 | Multiple Exemplar-Based Facial Image Retrieval Using Independent Component Analysis · IEEE Trans. Image Process. 2006 |
Multimedia analysis and retrieval › image retrieval
content-based image retrieval |
0.1 | 1 | 2006 | Multiple Exemplar-Based Facial Image Retrieval Using Independent Component Analysis · IEEE Trans. Image Process. 2006 |
Hardware reliability and fault tolerance
error correction |
0.0 | 1 | 2011 | Redundancy Mining for Soft Error Detection in Multicore Processors · IEEE Trans. Computers 2011 |
Distributed systems › fault tolerance
rollback recovery |
0.0 | 1 | 2011 | Redundancy Mining for Soft Error Detection in Multicore Processors · IEEE Trans. Computers 2011 |
Hardware reliability and fault tolerance › soft errors
transient fault |
0.0 | 1 | 2011 | Redundancy Mining for Soft Error Detection in Multicore Processors · IEEE Trans. Computers 2011 |
Methods — techniques the papers use, named apart from their topics
temporal redundancy · 0.1simulation · 0.1residue code check bits · 0.1data value redundancy · 0.1independent component analysis · 0.1feature combination · 0.1
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2011 | Redundancy Mining for Soft Error Detection in Multicore ProcessorsabstractThe trends in technology scaling and the reduction in supply voltages have significantly improved the performance and energy consumption in modern microprocessors. Microprocessors are being built with higher degrees of spatial parallelism and deeper pipelines to improve performance, which, however, makes them more susceptible to transient faults. Radiation causes "transient faults” or "single-event transients” in logic, which, once propagated and latched, become full cycle errors or soft errors. If radiation hits memory elements, this is usually called an "single-event upset” or "soft error” as it can further propagate as a full cycle error. The problem of soft errors is further exacerbated in large multiprocessors employed in servers in which reliability is a key concern. In the past, the technique of lockstep execution of the original and the duplicate instructions has been used for error detection in multiprocessors. However, the execution of redundant threads in the on-chip multiprocessor (CMP) provides error detection at lower overheads, since the branch outcomes of the leading thread can be exploited during the execution of the trailing thread, and also because the interprocessor communication latency is a key concern for lockstepping. In this paper, we show that by mining various redundancies inherent within a single core, the interprocessor communication can be brought down to a minimum. Toward this, we propose techniques based on 1) temporal redundancy, 2) data value redundancy, and 3) information redundancy for error detection in multicore designs. We exploit temporal redundancy by using the "latency slack cycles” (LSC) of an instruction, which we define as the number of cycles before the computed result from the instruction becomes the source operand of a subsequent instruction. The value-based detection technique is explored by exploiting the width of the operands with small data values and information redundancy is exploited by the generation of residue code check bits for the source operands. We show that with a clustered core multiprocessor, the interprocessor communication overhead can be significantly reduced. In our proposed multicore design, when a soft error is detected, error correction is achieved by rolling back the execution to a previous checkpoint state and re-executing the instructions. The proposed techniques have been implemented on the RSIM simulation framework and validated using the SPLASH benchmarks. Experimental results indicate that the soft error detection schemes proposed in this work, can be implemented, on the average, with less than 10 percent increase in CPI on modern multicore designs. Ransford Hyman Jr., Koustav Bhattacharya, N. Ranganathan |
IEEE Trans. Computers | 2 |
| 2011 | Placement for Immunity of Transient Faults in Cell-Based Design of Nanometer CircuitsabstractThe rate of soft errors have been significantly increasing due to the aggressive scaling trends in the nanometer regime. Several circuit optimization techniques have been proposed in literature for preventing such transient faults, however, to the best of our knowledge, the reduction of soft error rate at the layout level has not been attempted in logic circuits. In this work, we show that transient glitches due to cosmic strikes can be sufficiently reduced by intelligently modifying the placement stage in cell based designs to selectively assign larger wirelengths to certain critical nets. Towards this, we propose a computationally efficient placement algorithm based on quadratic programming that significantly reduces the soft error rates of logic circuits. The algorithm tries to assign higher wirelengths for nets with low glitch masking probabilities for higher reduction in soft error rates (SER), while maintaining low delay and area penalty for the overall circuit. Experimental results on the ISCAS'85 benchmark circuits indicate that such a placement algorithm can significantly improve the soft error immunity in logic circuits without much delay and area overheads. Koustav Bhattacharya, N. Ranganathan |
IEEE Trans. Very Large Scale Integr. Syst. | 1 |
| 2010 | A VLSI Architecture and Algorithm for Lucas-Kanade-Based Optical Flow ComputationabstractOptical flow computation in vision-based systems demands substantial computational power and storage area. Hence, to enable real-time processing at high resolution, the design of application-specific system for optic flow becomes essential. In this paper, we propose an efficient VLSI architecture for the accurate computation of the Lucas-Kanade (L-K)-based optical flow. The L-K algorithm is first converted to a scaled fixed-point version, with optimal bit widths, for improving the feasibility of high-speed hardware implementation without much loss in accuracy. The algorithm is mapped onto an efficient VLSI architecture and the data flow exploits the principles of pipelining and parallelism. The optical flow estimation involves several tasks such as Gaussian smoothing, gradient computation, least square matrix calculation, and velocity estimation, which are processed in a pipelined fashion. The proposed architecture was simulated and verified by synthesizing onto a Xilinx Field Programmable Gate Array, which utilize less than 40% of system resources while operating at a frequency of 55 MHz. Experimental results on benchmark sequences indicate 42% improvement in accuracy and a speed up of five times, compared to a recent hardware implementation of the L-K algorithm. Venkataraman Mahalingam, Koustav Bhattacharya, N. Ranganathan, Hari Chakravarthula, Robin R. Murphy, Kevin S. Pratt |
IEEE Trans. Very Large Scale Integr. Syst. | 2 |
| 2009 | A VLSI System Architecture for Optical Flow ComputationabstractThe computation of optical flow in video sequences is a challenging task in most camera based scene interpretation systems. In the past, most optical flow computation algorithms has been either implemented in software running on general purpose processors or designed as an application specific hardware. However, these implementations either cannot support real-time processing requirements or result in excessive inaccuracies in the computed velocity values. In this work, we propose a efficient VLSI system architecture for computing the optical flow in video sequences using the Lucas-Kanade (L-K) algorithm. The algorithm is converted into high speed RTL implementation by exploiting the inherent paralellism in the data flow graph. Clever pipelining strategies has been used throughout the design to further improve the speedup of velocity computation. We have mapped the RTL design on a Xilinx Virtex II Field Programmable Gate Arrays (FPGA) supported with Kingston DIMM DDR memory module, and a Pixel-Plus 2.0 Mega-pixel camera on the XUPV2P FPGA board. Experimental results of our proposed design showed significant improvements in accuracy with a speedup of five times when compared with other recent hardware implementations. Koustav Bhattacharya, Venkataraman Mahalingam, N. Ranganathan |
ISCAS | 1 |
| 2009 | A Strategy for Soft Error Reduction in Multi Core DesignsabstractWith the continuous decrease in the minimum feature size and increase in the chip density, modern processors are being increasingly susceptible to soft errors. In the past, the technique of lockstep execution with redundant threads on duplicated pipelines have been used for soft error rate reduction which can achieve high error coverage but at the cost of large overheads in terms of area and performance. In this paper, we propose techniques for protection against soft errors in multi-core designs using (i) the properties of spatial and temporal redundancy and (ii) value based detection. We utilize temporal redundancy by using the ldquolatency use slackrdquo (LSC) of an instruction, which we define as the number of cycles before the computed result from the instruction becomes the source operand of a subsequent instruction, while spatial redundancy is exploited by duplicating the instruction to a nearby idle processor core. Further, the value based detection technique is explored by exploiting the width of the operands with small data values and the generation of residue code check bits for the source operands. When a soft error is detected, error correction is achieved by rolling back the execution to a previous checkpoint state and re-executing the instructions. The proposed techniques have been implemented on the RSIM simulation framework and validated using the SPLASH benchmarks. Our results indicate that the soft error detection schemes proposed in this work, can be implemented, on average, with less than 10% increase in CPI on modern multi-core designs. Ransford Hyman Jr., Koustav Bhattacharya, N. Ranganathan |
ISCAS | 2 |
| 2009 | A Framework for Correction of Multi-Bit Soft Errors in L2 Caches Based on RedundancyabstractWith the continuous decrease in the minimum feature size and increase in the chip density due to technology scaling, on-chip L2 caches are becoming increasingly susceptible to multi-bit soft errors. The increase in multi-bit errors could lead to higher risk of data corruption and potentially result in the crashing of application programs. Traditionally, the L2 caches have been protected from soft errors using techniques such as: 1) error detection/correction codes; 2) physical interleaving of cache bit lines to convert multi-bit errors into single-bit errors; and 3) cache scrubbing. While the first two methods incur large area overheads for multi-bit errors, identifying the time interval for scrubbing could be tricky. In this paper, we investigate in detail the multi-bit soft error rates in large L2 caches and propose a framework of solutions for their correction based on the amount of redundancy present in the memory hierarchy. We investigate several new techniques for reducing multi-bit errors in large L2 caches, in which, the multi-bit errors are detected using simple error detection codes and corrected using the data redundancy in the memory hierarchy. We also propose several techniques to control/mine the redundancy in the memory hierarchy to further improve the reliability of the L2 cache. The proposed techniques were implemented in the Simplescalar framework and validated using the SPEC 2000 integer and floating point benchmarks for L2 cache vulnerability, global cache miss-rate, average cycle count and main memory write back rate, considering the area and power overheads. Experimental results indicate that the vulnerability of L2 caches can be decreased by 40% on the average for integer benchmarks and 32% on the average for floating point benchmarks, with an average multi-bit error coverage of about 96%, with significantly less area and power overheads and with virtually no performance penalty. The proposed techniques are applicable to both single and multi-core processor-based systems. Koustav Bhattacharya, N. Ranganathan, Soontae Kim |
IEEE Trans. Very Large Scale Integr. Syst. | 1 |
| 2008 | A linear programming formulation for security-aware gate sizingabstractDifferential power analysis (DPA) has been shown to be the dominant type of side-channel attacks that significantly jeopardize the security in integrated circuits. It has been shown that the data, the functional unit operations as well as the internal micro-architectures can be detected through current and power analysis. Subsequently, different CMOS logic styles have been proposed in the literature for performing computations in such a manner that the current and power signatures can be concealed through reduction of the variance in transient power dissipation. In this work, we propose a gate sizing formulation based on traditional static CMOS standard cells that improves the security of the circuits while maintaining low overheads in terms of area, power and delay. The proposed algorithm considers all disjoint paths from primary inputs to the primary outputs, performing gate sizing with the objective of balancing the switched path capacitances among the various paths making it difficult to extract power or current signatures through current or power profiling. Further, we show that the path based security aware gate sizing formulation is NP-complete and propose a greedy approximation algorithm based on linear programming. The proposed algorithm has been implemented and validated on the ISCAS85 benchmarks and the experimental results indicate a reduction of the variance of transient dynamic power by about 40% with very low overhead in terms of delay, area and power. Koustav Bhattacharya, N. Ranganathan |
ACM Great Lakes Symposium on VLSI | 1 |
| 2008 | Reliability-centric gate sizing with simultaneous optimization of soft error rate, delay and powerabstractThe reliability against transient faults poses a significant challenge due to technology scaling trends. Several circuit optimization techniques have been proposed in the literature for preventing soft errors in logic circuits. However, most approaches do not incorporate the effects of other design metrics like delay and power while optimizing the circuit for soft error protection. In this work, we develop a first order model of the soft error phenomenon in logic circuits and incorporate power and delay metrics to formulate a convex programming based reliability-centric gate sizing technique. The proposed algorithm has been implemented and validated on the ISCAS`85 benchmarks. Experimental results indicate that our multi-objective optimization technique can achieve significant reductions in soft error rate with simultaneous optimization of delay and power. Koustav Bhattacharya, N. Ranganathan |
ISLPED | 1 |
| 2007 | Improving the reliability of on-chip L2 cache using redundancyabstractThe reliability of large on-chip L2 cache poses a significant challenge due to technology scaling trends. As the minimum feature size continues to decrease, the L2 caches become more vulnerable to multi-bit soft errors. Traditionally, L2 caches have been protected from multi-bit soft errors using techniques like using error detection/correction codes or employing physical interleaving of cache bit lines to convert multi-bit errors into single-bit errors. These methods, however, incur large overheads in area and power. In this work, we investigate several new techniques for reducing multi-bit errors in large L2 caches, in which the multi-bit errors are detected using simple error detection codes and corrected using the data redundancy in the memory hierarchy. Further, we develop a reliability aware replacement policy that dynamically trades performance for reliability whenever the soft-error budget is exceeded. In order to further improve reliability, we propose the duplication of the data values in cache lines by exploiting their small data widths. The proposed techniques were implemented in the Simplescalar framework and validated using the SPEC 2000 integer and floating point benchmarks. The proposed techniques improve the reliability of L2 caches by 40% and 32% on the average, for integer and floating point applications respectively, with little impact on performance and area. Koustav Bhattacharya, Soontae Kim, N. Ranganathan |
ICCD | 1 |
| 2006 | Multiple Exemplar-Based Facial Image Retrieval Using Independent Component AnalysisabstractIn this paper, we design a content-based image retrieval system where multiple query examples can be used to indicate the need to retrieve not only images similar to the individual examples, but also those images which actually represent a combination of the content of query images. We propose a scheme for representing content of an image as a combination of features from multiple examples. This scheme is exploited for developing a multiple example-based retrieval engine. We have explored the use of machine learning techniques for generating the most appropriate feature combination scheme for a given class of images. The combination scheme can be used for developing purposive query engines for specialized image databases. Here, we have considered facial image databases. The effectiveness of the image retrieval system is experimentally demonstrated on different databases. Jayanta Basak, Koustav Bhattacharya, Santanu Chaudhury |
IEEE Trans. Image Process. | 2 |