This article is an abridged and translated version of a mission report initially written for the Scientific Service of the French Embassy in Japan. the mission took place in Japan from the 14th to the 21st of October, 1989. an introduction gives the necessary background concerning the applications of fuzzy sets to process control and expert systems; specialized hardwares for these applications are also introduced. Section II offers an account of the visits done during the mission. Section III synthesizes the lesson of the mission. the title makes use of the expression “fuzzy boom” which is often employed in Japan for describing the present blossoming of a great number of practical applications of fuzzy sets and their important repercussion in the media of this country.

An effort has been made to evaluate the fault coverage of functional test methods. A study comparing a structural (manufacturing) test and three functional test methods, a tailored test, a systematic pseudo-exhaustive test, and a random test, is presented. The experiments were performed on defective microprocessors (6800 and 68000). Working with a nonbiased sample of circuits was a major concern; thus, randomly distributed defects were created on a set of good circuits by cutting either Al or poly-Si tracks using microcutter machine equipment. The results concerning defect coverage and Boolean defect coverage are largely better than those given by H.P. Klug (1988). The results indicate that the functional methods evaluated are very thorough. Random test seems to achieve an impressive fault coverage.>

A number of functional-level test approaches for microprocessors have been proposed. The GAPT approach, presented here, is a pragmatic one, but it is supported by a set of tools and experimental results. The authors describe the GAPT approach in detail. They draw tentative conclusions with respect to the effectiveness and scope of these functional test generation methods.>

This paper presents an automatic generation system for behavioral test programs of microprocessors. First, the test environment is presented, as well as its consequences on test program generation. In the second part, the test principles are outlined; it is a behavioral test, i.e a test determined from the user's description of the microprocessor; the resulting test programs are quite modular. The third part presents the description language and the generation system.

This paper deals with the protection of a dedicated subsystem against an erroneous environment. The inputs of the subsystem can be erroneous and the subsystem must be able to detect erroneous inputs and to recover from them.