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Akihiko Yamada

dblp:80/3116 · DBLP profile ↗
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8ranked-venue papers
4as first author
0since 2021 · last 1990
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 8 · 4 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
6 papers
Electronic design automation · 93% Integrated circuit design · 7%

Topics — the 6 heaviest of 8, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation
hardware verification and test
0.051982
Timing verification system based on delay time hierarchical nature · DAC 1982
Hierarchical design verification for large digital systems · DAC 1981
MIXS: A mixed level simulator for large digital system logic verification · DAC 1980
Electronic design automation › hardware verification and test
test generation
0.021978
Automatic System Level Test Generation and Fault Location for Large Digital Systems · DAC 1978
Automatic test generation for large digital circuits · DAC 1977
Electronic design automation › hardware verification and test
timing verification
0.011982
Timing verification system based on delay time hierarchical nature · DAC 1982
Electronic design automation › hardware test
fault localization
0.011978
Automatic System Level Test Generation and Fault Location for Large Digital Systems · DAC 1978
Electronic design automation › hardware verification and test › test generation › high-level test generation
system-level test generation
0.011978
Automatic System Level Test Generation and Fault Location for Large Digital Systems · DAC 1978
Integrated circuit design
digital circuit design
0.011982
Timing verification system based on delay time hierarchical nature · DAC 1982

Methods — techniques the papers use, named apart from their topics

time wheel algorithm · 0.0selective trace algorithm · 0.0path tracing algorithm · 0.0node model · 0.0
YearPublicationVenuePosition
1990 Challenge of design and test of ultra-large-scale circuits
abstract
Summary form only given. It is pointed out that, with the advent of ultra-large-scale integration, the design and test of digital circuits are becoming more and more difficult. Effective approaches to solving this problem are hierarchical processing and structured design-for-testability. It is noted that design verification and automatic test generation systems can handle a circuit with millions of gates by using a hierarchical processing approach and a partitioning technique based on scan-path structure.>
Akihiko Yamada
ITC1
1982 Timing verification system based on delay time hierarchical nature
abstract
A hierarchical timing verification system is described. It can evaluate all logical paths in a chip without any specific manual input information, using a path tracing algorithm.
Minoru Nomura, Shinichi Sato, Nobuo Takano, Toshinori Aoyama, Akihiko Yamada
DAC5
1981 Hierarchical design verification for large digital systems
Tohru Sasaki, Akihiko Yamada, Toshinori Aoyama, Katsutoshi Hasegawa, Shunichi Kato, Shinichi Sato
DAC2
1981 Design automation status in Japan
Akihiko Yamada
DAC1
1981 A Calculus of Testability Measure at the Functional Level
Shigeru Takasaki, Masato Kawai, Shigehiro Funatsu, Akihiko Yamada
ITC4
1980 MIXS: A mixed level simulator for large digital system logic verification
abstract
A mixed level simulator, MIXS, is a logic verification tool which has multiple simulation capabilities. Main MIXS techniques are time wheel and selective trace algorithm for functional level simulation based on 'node' model concept and the linkage function of functional models, described in different detail, with network information. The mixed level simulation for large digital systems can be achieved very efficiently by using the above techniques.
Tohru Sasaki, Akihiko Yamada, Shunichi Kato, Terufumi Nakazawa, Kyoji Tomita, Nobuyoshi Nomizu
DAC2
1978 Automatic System Level Test Generation and Fault Location for Large Digital Systems
Akihiko Yamada, Nobuo Wakatsuki, T. Fukui, Shigehiro Funatsu
DAC1
1977 Automatic test generation for large digital circuits
Akihiko Yamada, Nobuo Wakatsuki, Hideo Shibano, Osamu Itoh, Kyoji Tomita, Shigehiro Funatsu
DAC1