Demo Data from VLDB 2026 / reviewers in the wild / expert
Akihiko Yamada
dblp:80/3116
· DBLP profile ↗
8ranked-venue papers
4as first author
0since 2021 · last 1990
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 8 · 4 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
6 papers |
Electronic design automation · 93% Integrated circuit design · 7% |
Topics — the 6 heaviest of 8, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation
hardware verification and test |
0.0 | 5 | 1982 | Timing verification system based on delay time hierarchical nature · DAC 1982 Hierarchical design verification for large digital systems · DAC 1981 MIXS: A mixed level simulator for large digital system logic verification · DAC 1980 |
Electronic design automation › hardware verification and test
test generation |
0.0 | 2 | 1978 | Automatic System Level Test Generation and Fault Location for Large Digital Systems · DAC 1978 Automatic test generation for large digital circuits · DAC 1977 |
Electronic design automation › hardware verification and test
timing verification |
0.0 | 1 | 1982 | Timing verification system based on delay time hierarchical nature · DAC 1982 |
Electronic design automation › hardware test
fault localization |
0.0 | 1 | 1978 | Automatic System Level Test Generation and Fault Location for Large Digital Systems · DAC 1978 |
Electronic design automation › hardware verification and test › test generation › high-level test generation
system-level test generation |
0.0 | 1 | 1978 | Automatic System Level Test Generation and Fault Location for Large Digital Systems · DAC 1978 |
Integrated circuit design
digital circuit design |
0.0 | 1 | 1982 | Timing verification system based on delay time hierarchical nature · DAC 1982 |
Methods — techniques the papers use, named apart from their topics
time wheel algorithm · 0.0selective trace algorithm · 0.0path tracing algorithm · 0.0node model · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1990 | Challenge of design and test of ultra-large-scale circuitsabstractSummary form only given. It is pointed out that, with the advent of ultra-large-scale integration, the design and test of digital circuits are becoming more and more difficult. Effective approaches to solving this problem are hierarchical processing and structured design-for-testability. It is noted that design verification and automatic test generation systems can handle a circuit with millions of gates by using a hierarchical processing approach and a partitioning technique based on scan-path structure.> Akihiko Yamada |
ITC | 1 |
| 1982 | Timing verification system based on delay time hierarchical natureabstractA hierarchical timing verification system is described. It can evaluate all logical paths in a chip without any specific manual input information, using a path tracing algorithm. Minoru Nomura, Shinichi Sato, Nobuo Takano, Toshinori Aoyama, Akihiko Yamada |
DAC | 5 |
| 1981 | Hierarchical design verification for large digital systems
Tohru Sasaki, Akihiko Yamada, Toshinori Aoyama, Katsutoshi Hasegawa, Shunichi Kato, Shinichi Sato |
DAC | 2 |
| 1981 | Design automation status in Japan
Akihiko Yamada |
DAC | 1 |
| 1981 | A Calculus of Testability Measure at the Functional Level
Shigeru Takasaki, Masato Kawai, Shigehiro Funatsu, Akihiko Yamada |
ITC | 4 |
| 1980 | MIXS: A mixed level simulator for large digital system logic verificationabstractA mixed level simulator, MIXS, is a logic verification tool which has multiple simulation capabilities. Main MIXS techniques are time wheel and selective trace algorithm for functional level simulation based on 'node' model concept and the linkage function of functional models, described in different detail, with network information. The mixed level simulation for large digital systems can be achieved very efficiently by using the above techniques. Tohru Sasaki, Akihiko Yamada, Shunichi Kato, Terufumi Nakazawa, Kyoji Tomita, Nobuyoshi Nomizu |
DAC | 2 |
| 1978 | Automatic System Level Test Generation and Fault Location for Large Digital Systems
Akihiko Yamada, Nobuo Wakatsuki, T. Fukui, Shigehiro Funatsu |
DAC | 1 |
| 1977 | Automatic test generation for large digital circuits
Akihiko Yamada, Nobuo Wakatsuki, Hideo Shibano, Osamu Itoh, Kyoji Tomita, Shigehiro Funatsu |
DAC | 1 |