Demonstration venue · read-only. Every page can be browsed; the buttons that would change it are switched off. Create an account to run TaxoReview on your own data. A simulation from public publication records: the people listed were not invited and did not agree to review.
? Tutorial for this page

Nancy E. Rallis

dblp:85/1902 · DBLP profile ↗
← Back
1ranked-venue papers
1as first author
0since 2021 · last 2001
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Software engineering, systems software and programming languages · 1 · 1 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Software engineering, system software, and programming languages
1 paper
Software testing · 100%

Topics — the 3 heaviest of 3, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Software testing
fault detection
0.012001
Reliability Estimation for a Software System with Sequential Independent Reviews · IEEE Trans. Software Eng. 2001
Software testing › software reliability
reliability estimation
0.012001
Reliability Estimation for a Software System with Sequential Independent Reviews · IEEE Trans. Software Eng. 2001
Software testing
software reliability
0.012001
Reliability Estimation for a Software System with Sequential Independent Reviews · IEEE Trans. Software Eng. 2001

Methods — techniques the papers use, named apart from their topics

sequential test and correction cycles · 0.0
YearPublicationVenuePosition
2001 Reliability Estimation for a Software System with Sequential Independent Reviews
abstract
Suppose that several sequential test and correction cycles have been completed for the purpose of improving the reliability of a given software system. One way to quantify the success of these efforts is to estimate the probability that all faults are found by the end of the last cycle, We describe how to evaluate this probability both prior to and after observing the numbers of faults detected in each cycle and we show when these two evaluations would be the same.
Nancy E. Rallis, Zachary F. Lansdowne
IEEE Trans. Software Eng.1