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Leona Y. Fung

dblp:85/4114 · DBLP profile ↗
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2ranked-venue papers
0as first author
0since 2021 · last 1983
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 2

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
2 papers
Hardware reliability and fault tolerance · 58% Integrated circuit design · 29% Processor architecture and microarchitecture · 13%

Topics — the 4 heaviest of 4, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Hardware reliability and fault tolerance › error detection
concurrent error detection
0.021983
Concurrent Error Detection in Multiply and Divide Arrays · IEEE Trans. Computers 1983
Concurrent Error Detection in ALU's by Recomputing with Shifted Operands · IEEE Trans. Computers 1982
Integrated circuit design
digital circuit design
0.021983
Concurrent Error Detection in Multiply and Divide Arrays · IEEE Trans. Computers 1983
Concurrent Error Detection in ALU's by Recomputing with Shifted Operands · IEEE Trans. Computers 1982
Hardware reliability and fault tolerance › redundancy
time redundancy
0.021983
Concurrent Error Detection in Multiply and Divide Arrays · IEEE Trans. Computers 1983
Concurrent Error Detection in ALU's by Recomputing with Shifted Operands · IEEE Trans. Computers 1982
Processor architecture and microarchitecture › arithmetic unit
arithmetic logic unit
0.011982
Concurrent Error Detection in ALU's by Recomputing with Shifted Operands · IEEE Trans. Computers 1982

Methods — techniques the papers use, named apart from their topics

recomputing with shifted operands · 0.0fault model · 0.0
YearPublicationVenuePosition
1983 Concurrent Error Detection in Multiply and Divide Arrays
abstract
A method proposed for concurrent error detection in ALU's is used in the design of multiplier and divider arrays. This method, called recomputing with shifted operands (RESO), can detect all errors caused by failures confined to a cell of the cellular array. The assumption that the failures are confined to a small area of an integrated circuit and the precise nature of the failures is not known is very applicable to VLSI circuits. RESO uses time redundancy for error detection and requires only a small increase in the hardware of a multiply and divide array.
Janak H. Patel, Leona Y. Fung
IEEE Trans. Computers2
1982 Concurrent Error Detection in ALU's by Recomputing with Shifted Operands
abstract
A new method of concurrent error detection in the Arithmetic and Logic Units (ALU's) is proposed. This method, called "Recomputing with Shifted Operands" (RESO), can detect errors in both the arithmetic and logic operations. RESO uses the principle of time redundancy in detecting the errors and achieves its error detection capability through the use of the already existing replicated hardware in the form of identical bit slices. It is shown that for most practical ALU implementations, including the carry-lookahead adders, the RESO technique will detect all errors caused by faults in a bit-slice or a specific subcircuit of the bit slice. The fault model used is more general than the commonly assumed stuck-at fault model. Our fault model assumes that the faults are confined to a small area of the circuit and that the precise nature of the faults is not known. This model is very appropriate for the VLSI circuits.
Janak H. Patel, Leona Y. Fung
IEEE Trans. Computers2