Demo Data from VLDB 2026 / reviewers in the wild / expert
Thomas Ordas
dblp:86/3016
· DBLP profile ↗
4ranked-venue papers
0as first author
2since 2021 · last 2022
0000-0001-5317-0538ORCID · corroborated
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 3 · 1 since 2021Security and privacy · 1 · 1 since 2021
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Network and information security
1 paper |
Hardware security and side channels · 100% | |
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 100% |
Topics — the 5 heaviest of 5, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Hardware security and side channels › side-channel attack › electromagnetic side channel
electromagnetic side-channel analysis |
0.6 | 1 | 2022 | Checking Robustness Against EM Side-Channel Attacks Prior to Manufacturing · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2022 |
Hardware security and side channels
leakage analysis |
0.6 | 1 | 2022 | Checking Robustness Against EM Side-Channel Attacks Prior to Manufacturing · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2022 |
Hardware security and side channels › hardware attacks
side-channel and fault attacks |
0.6 | 1 | 2022 | Checking Robustness Against EM Side-Channel Attacks Prior to Manufacturing · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2022 |
Electronic design automation
physical design |
0.2 | 1 | 2022 | Checking Robustness Against EM Side-Channel Attacks Prior to Manufacturing · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2022 |
Electronic design automation › power integrity
voltage drop analysis |
0.2 | 1 | 2022 | Checking Robustness Against EM Side-Channel Attacks Prior to Manufacturing · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2022 |
Methods — techniques the papers use, named apart from their topics
noise-to-add · 1.1magnetic field simulation · 1.1
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2022 | The More You Know: Improving Laser Fault Injection with Prior KnowledgeabstractWe consider finding as many faults as possible on the target device in the laser fault injection security evaluation. Since the search space is large, we require efficient search methods. Recently, an evolutionary approach using a memetic algorithm was proposed and shown to find more interesting parameter combinations than random search, which is commonly used. Unfortunately, once a variation on the bench or target is introduced, the process must be repeated to find suitable parameter combinations anew.To negate the effect of variation, we propose a novel method combining a memetic algorithm with a machine learning approach called a decision tree. Our approach improves the memetic algorithm by using prior knowledge of the target introduced in the initial phase of the memetic algorithm. In our experiments, the decision tree rules enhance the performance of the memetic algorithm by finding more interesting faults in different samples of the same target. Our approach shows more than two orders of magnitude better performance than random search and up to 60% better performance than previous state-of-the-art results with a memetic algorithm. Another advantage of our approach is human-readable rules, allowing the first insights into the explainability of target characterization for laser fault injection. Marina Krcek, Thomas Ordas, Daniele Fronte, Stjepan Picek |
FDTC | 2 |
| 2022 | Checking Robustness Against EM Side-Channel Attacks Prior to ManufacturingabstractElectromagnetic attacks, which in fact exploit essentially the magnetic field generated by ICs, are commonly used by adversaries to retrieve secret information manipulated by integrated circuits. Due to the increasing resolution and effectiveness of EM equipment used to perform these attacks, it is becoming increasingly difficult to design secure circuits robust enough to resist these attacks. The contribution of this article is threefold. First, it describes a simulation flow of the magnetic field radiated by ICs. The introduced flow is based on an industrial voltage drop tool: ANSYS RedHawk. Second, it introduces a methodology to localize the root cause of leakages in ICs as well as EM hotspots, i.e., positions above the IC surface, where an adversary can place its probe to capture secrets. The latter contribution is based on the concept of noise to add, which is introduced in this article in order to overcome the absence of noise in simulations (noise which is omnipresent in practice) that limits their interpretability. Finally, the article demonstrates the soundness of the proposed solution by confronting simulation results with measurements. Davide Poggi, Thomas Ordas, Alexandre Sarafianos, Philippe Maurine |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 2 |
| 2013 | Voltage Spikes on the Substrate to Obtain Timing FaultsabstractFault attacks are widely deployed against secure devices by hardware evaluation centers. While the least expensive fault injection techniques, like clock or voltage glitches, are well taken into account in secure devices by dedicated hardware counter-measures, more advanced techniques, such as light based attacks, require huge investments. This paper presents a new way to induce faults at a moderate cost that may defeat already in place hardware counter-measures. To demonstrate its effectiveness we applied this technique on an ASIC component. For this demonstration, fault exploitation is operated using the classic Bell core attack applied on a modular exponentiation supported by a modular arithmetic co-processor. Karim Tobich, Philippe Maurine, Pierre-Yvan Liardet, Mathieu Lisart, Thomas Ordas |
DSD | 5 |
| 2012 | Enhancing Electromagnetic Analysis Using Magnitude Squared IncoherenceabstractThis paper demonstrates that magnitude squared incoherence (MSI) analysis is efficient to localize hot spots, i.e., points at which focused electromagnetic (EM) analyses can be applied with success. It is also demonstrated that MSI may be applied to enhance differential EM analyses (DEMA) based on difference of means (DoM). Amine Dehbaoui, Victor Lomné, Thomas Ordas, Lionel Torres, Michel Robert, Philippe Maurine |
IEEE Trans. Very Large Scale Integr. Syst. | 3 |