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John Y. Sayah

dblp:90/1105 · DBLP profile ↗
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4ranked-venue papers
4as first author
0since 2021 · last 2005
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 3 · 3 first-authorArtificial intelligence and machine learning · 1 · 1 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Electronic design automation · 100%

Topics — the 5 heaviest of 5, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation
hardware verification and test
0.011992
Test Scheduling in High Performance VLSI System Implementations · IEEE Trans. Computers 1992
Electronic design automation › hardware test
parallel test execution
0.011992
Test Scheduling in High Performance VLSI System Implementations · IEEE Trans. Computers 1992
Electronic design automation › hardware verification and test
test scheduling
0.011992
Test Scheduling in High Performance VLSI System Implementations · IEEE Trans. Computers 1992
Electronic design automation › hardware verification and test › design for testability
built-in self-test
0.011992
Test Scheduling in High Performance VLSI System Implementations · IEEE Trans. Computers 1992
Electronic design automation › hardware verification and test
design for testability
0.011992
Test Scheduling in High Performance VLSI System Implementations · IEEE Trans. Computers 1992

Methods — techniques the papers use, named apart from their topics

schedulability criteria · 0.0heuristic scheduling algorithms · 0.0
YearPublicationVenuePosition
2005 On-demand business collaboration enablement with web services
John Y. Sayah, Liang-Jie Zhang
Decis. Support Syst.1
1992 Test Scheduling in High Performance VLSI System Implementations
abstract
The authors provide tools for exploring the inherent parallelism introduced by design for testability (DFT) and built-in self-test (BIST) techniques in order to reduce test length. Since the potential for parallel test execution is most apparent at the organization level and DFT and BIST hardware is also often added at that level, the organization level is used as a foundation for the work. A broader modeling foundation that encompasses both dimensions, space and time, of test parallelism is introduced. A set of simple schedulability criteria for concurrent issuing of tests is developed. Effective suboptimum heuristic-based algorithms for scheduling tests on general-purpose high-performance VLSI system implementation are presented. The scheduling algorithms have been implemented and performance results are presented.>
John Y. Sayah, Charles R. Kime
IEEE Trans. Computers1
1989 Scheduling unequal length tests in high performance VLSI system implementations
abstract
Testing high-performance VLSI systems containing pipelines and multifunctional units is considered. An efficient heuristic-based algorithm is presented for scheduling tests in systems requiring unequal number of tests (UNT) for the test function. Performance results for an experimental implementation of the algorithm are presented.>
John Y. Sayah, Charles R. Kime
ICCD1
1988 : Test Scheduling for High Performance VLSI System Implementations
abstract
A powerful suboptimum heuristic for scheduling tests on general-purpose high-performance VLSI system implementations is presented. A simple model that represents a system and its organization, at any level, by a labeled resource allocation graph between test functions and test and system resources was introduced. The resource allocation graph was utilized to produce a scheduling model and a simple schedulability condition. An algorithm based on mechanisms for generating optimum schedules was presented. The algorithm performs a preliminary greedy scan for valid scheduling cycles. The partial scan seeds an iterative improvement procedure which utilizes a controlled incremental departure from local optima to schedule functions that require an equal number of tests. Methods to utilize the algorithm for a general number of tests per function were also outlined. The implementation of an experimental version of the algorithm showed good performance.>
John Y. Sayah, Charles R. Kime
ITC1