In this paper, a new methodology for integrated circuit design considering the inevitable manufacturing and operating tolerances is presented. It is based on a new concept for specification analysis that provides exact worst-case transistor model parameters and exact worst-case operating conditions. Corresponding worst-case distances provide a key measure for the performance, the yield, and the robustness of a circuit. A new deterministic method for parametric circuit design that is based on worst-case distances is presented. It comprises nominal design, worst-case analysis, yield optimization, and design centering. In contrast to current approaches, it uses standard circuit simulators and at the same time considers deterministic design parameters of integrated circuits at reasonable computational costs. The most serious disadvantage of geometric approaches to design centering is eliminated, as the method's complexity increases only linearly with the number of design variables.>

Worst-case analysis is commonly used in integrated circuit design to verify a satisfactory circuit performance with regard to changes in the manufacturing conditions. However, worst-case analysis is often carried out using approximate worst-case parameter sets, that do not consider fluctuations in the operating conditions. This paper presents a new approach to the worst-case design of integrated circuits that takes account of fluctuations in the operating conditions. It provides unique and realistic worst-case manufacturing conditions and worst-case operating conditions for given circuit specifications. These specifications may be either, minimum yield requirements or, lower and upper performance bounds. A software package for worst-case analysis and optimization is presented and illustrated by two examples.