The design of active array structures in analog circuits requires careful matching to minimize the impact of variations. This work presents a constructive approach for building these arrays to directly incorporate shifts due to process variations, considering systematic first-order and second order gradients; to account for systematic layout effects, including parasitic mismatch and layout-dependent effects due to stress; and to ensure that the resulting layout delivers high performance. The proposed algorithms are targeted to FinFET technologies and are validated for multiple analog blocks in a commercial 12nm FinFET process. The layouts generated by the proposed method are demonstrated to provide better matching and performance than prior methods.

Despite the digitization of analog and the disaggregated silicon trends, high-volume or high-performance system-on-chip (SoC) designs integrate numerous analog and mixed-signal (AMS) intellectual property (IP) blocks including voltage regulators, clock generators, sensors, memory and other interfaces. For example, fine-grain dynamic voltage and frequency scaling requires a dedicated clock generator and voltage regulator per compute unit. The design of these blocks in advanced FinFET or GAAFET technologies is challenging due to the i) increasing gap between schematic and post-layout simulation, ii) design rule complexity, and iii) strict reliability rules [1]. The convergence of a high-performance or a high-power block may require multiple iterations of circuit sizing and layout changes. As a result, physical design, which is primarily a manual effort, has become a key bottleneck in the design process. Migrating these blocks across process technologies or process variants only exacerbates the problem. Layout synthesis for AMS IP blocks is an on-going research problem with a long history [2] and is gaining more attention recently to leverage the latest advances in machine learning [3]. Yet neither template nor optimization-based approaches have reduced the burden significantly for high performance products on leading process technologies

Well island generation and well tap placement is an important problem in analog/mixed-signal (AMS) circuits. Well taps can only prevent latchups within a certain radius of influence within a well island, and hence must be appropriately inserted to cover all devices. However, existing automated AMS layout paradigms typically defer the insertion of well taps and creation of well islands to a post-processing step after placement. This alters the placement, resulting in increased area and wire length, as well as circuit performance degradation. Therefore, there is a strong need for a solution that generates well islands and inserts well taps during placement so the placer can account for well overheads in optimizing placement metrics. In this work, we propose a modular solution using a graph-based optimization scheme that can be used within multiple placement paradigms with minimal intrusion. We demonstrate the integration of this scheme into stochastic, analytical, and designer-driven row-based placement. The method is demonstrated in advanced FinFET technologies. Layouts generated using this scheme show better area, wire length, and performance metrics at the cost of a marginal runtime degradation when compared to the post-processing approach. Using our scheme, there is an average improvement of 3% and 4% and a maximum improvement of 23% and 11% in area and wirelength, respectively, of layouts of various classes of AMS circuits at the cost of 17% average and 29% maximum increase in total runtime.

An analog/mixed-signal designer typically performs circuit optimization, involving intensive SPICE simulations, on a schematic netlist and then sends the optimized netlist to layout. During the layout phase, it is vital to maintain symmetry requirements to avoid performance degradation due to mismatch: these constraints are usually specified using user input or by invoking an external tool. Moreover, to achieve high performance, the layout must avoid large interconnect parasitics on critical nets. Prior works that optimize parasitics during placement work with coarse metrics such as the half-perimeter wire length, but these metrics do not appropriately emphasize performance-critical nets. The novel charge flow (CF) formulation in this work addresses both symmetry detection and parasitic optimization. By leveraging schematic-level simulations, which are available “for free” from the circuit optimization step, the approach (a) alters the objective function to emphasize the reduction of parasitics on performance-critical nets, and (b) identifies symmetric elements/element groups. The effectiveness of the CF-based approach is demonstrated on a variety of circuits within a stochastic placement engine.

Well island generation and well tap placement pose an important challenge in automated analog/mixed-signal (AMS) layout. Well taps prevent latchup within a radius of influence in a well island, and must cover all devices. Automated AMS layout flows typically perform well island generation and tap insertion as a postprocessing step after placement. However, this step is intrusive and potentially alters the placement, resulting in increased area, wire length, and performance degradation. This work develops a graph-based optimization that integrates well island generation, well tap insertion, and placement. Its efficacy is demonstrated within a stochastic placement engine. Experimental results show that this approach generates better area, wire length and performance metrics than traditional methods, at the cost of a marginal runtime degradation.

Common-centroid (CC) layouts are widely used in analog design to make circuits resilient to variations by matching device characteristics. However, CC layout may involve increased routing complexity and higher parasitics than other alternative layout schemes. This paper critically analyzes the fundamental assumptions behind the use of common-centroid layouts, incorporating considerations related to systematic and random variations as well as the performance impact of common-centroid layout. Based on this study, conclusions are drawn on when CC layout styles can reduce variation, improve performance (even if they do not reduce variation), and when non-CC layouts are preferable.

The common-centroid (CC) layout style is widely used to minimize the impact of variations among matched devices in analog blocks such as current mirror banks and differential pairs. This paper presents a constructive, performance-aware CC placement and routing algorithm for transistor arrays. Specifically, the proposed approach maximizes diffusion sharing, incorporates length of diffusion (LOD) based stress-induced performance variations, and mitigates resistive parasitics and electromigration (EM) hotspots, all of which are critical in modern technology nodes. The proposed algorithms are validated using cell- and circuit-level test cases in a commercial 12nm FinFET process. As compared to existing works, the cells generated using the proposed approach are shown to provide better performance in the presence of systematic variations, LOD, layout parasitics, and EM-induced degradation.

The quality of layouts generated by automated analog design have traditionally not been able to match those from human designers over a wide range of analog designs. The ALIGN (Analog Layout, Intelligently Generated from Netlists) project [2, 3, 6] aims to build an open-source analog layout engine [1] that overcomes these challenges, using a variety of approaches. An important part of the toolbox is the use of machine learning (ML) methods, combined with traditional methods, and this talk overviews our efforts. The input to ALIGN is a SPICE-like netlist and a set of perfor- mance specifications, and the output is a GDSII layout. ALIGN automatically recognizes hierarchies in the input netlist. To detect variations of known blocks in the netlist, approximate subgraph iso- morphism methods based on graph convolutional networks can be used [5]. Repeated structures in a netlist are typically constrained by layout requirements related to symmetry or matching. In [7], we use a mix of graph methods and ML to detect symmetric and array structures, including the use of neural network based approximate matching through the use of the notion of graph edit distances. Once the circuit is annotated, ALIGN generates the layout, going from the lowest level cells to higher levels of the netlist hierarchy. Based on an abstraction of the process design rules, ALIGN builds parameterized cell layouts for each structure, accounting for the need for common centroid layouts where necessary [11]. These cells then undergo placement and routing that honors the geomet- ric constraints (symmetry, common-centroid). The chief parameter that changes during layout is the set of interconnect RC parasitics: excessively large RCs could result in an inability to meet perfor- mance. These values can be controlled by reducing the distance between blocks, or, in the case of R, by using larger effective wire widths (using multiple parallel connections in FinFET technologies where wire widths are quantized) to reduce the effective resistance. ALIGN has developed several approaches based on ML for this purpose [4, 8, 9] that rapidly predict whether a layout will meet the performance constraints that are imposed at the circuit level, and these can be deployed together with conventional algorithmic methods [10] to rapidly prune out infeasible layouts. This presentation overviews our experience in the use of ML- based methods in conjunction with conventional algorithmic ap- proaches for analog design. We will show (a) results from our efforts so far, (b) appropriate methods for mixing ML methods with tra- ditional algorithmic techniques for solving the larger problem of analog layout, (c) limitations of ML methods, and (d) techniques for overcoming these limitations to deliver workable solutions for analog layout automation.

Automating analog layout is a long-standing research problem, with a history that goes back several decades. While digital design is largely automated today, analog layout has been significantly more resistant: automation has not made much headway in industry settings. There are several reasons for this, including:

We present an approach for verifying locking of charge-pump phase-locked loops by performing reachability analysis on a behavioral model of the circuit. Bounded uncertain parameters in the behavioral model make it possible to represent all possible behaviors of more detailed models. The dynamics of the behavioral model is hybrid (i.e., discrete and continuous) due to the switching of charge pumps that drive the analog control circuits. A unique feature of phase-locked loops compared to most other hybrid systems is that they require thousands of switchings in the continuous dynamics to converge sufficiently close to a limit cycle. This makes reachability analysis a challenging task since switches in the dynamics are expensive to compute and result in conservative overapproximations. We solve this problem by overapproximating the effects of the switching conditions with uncertain parameters in linear continuous models, a method we call continuization. Using efficient reachability algorithms for discrete-time linear systems, locking is verified over the complete range of possible initial states of a charge-pump PLL designed in 32nm CMOS SOI technology in comparable time required for Monte Carlo simulations of the same behavioral model.

With aggressive technology scaling, SRAM design has been seriously challenged by the difficulties in analyzing rare failure events. In this paper we propose to create statistical performance models with accuracy sufficient to facilitate probability extraction for SRAM parametric failures. A piecewise modeling technique is first proposed to capture the performance metrics over the large variation space. A controlled sampling scheme and a nested Monte Carlo analysis method are then applied for the failure probability extraction at cell-level and array-level respectively. Our 65nm SRAM example demonstrates that by combining the piecewise model and the fast probability extraction methods, we have significantly accelerated the SRAM failure analysis.

This paper presents a novel stochastic modeling and optimization framework for energy minimization in multicore systems running real-time applications with tolerance to deadline misses. This framework is based on stochastic application models, which capture the variability of and the spatial and temporal correlations among the workloads of concurrent and interdependent tasks that constitute the application. These stochastic models are utilized in novel mathematical formulations to obtain optimal energy management policies. Experimental results on MPEG2 video decoding show that significant energy savings can be achieved, often close to the theoretical upper bound.