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Sheau-Suey Li

dblp:92/2119 · DBLP profile ↗
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1ranked-venue papers
0as first author
0since 2021 · last 1982
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Integrated circuit design · 56% Electronic design automation · 44%

Topics — the 3 heaviest of 3, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation
circuit simulation		 0.011982
Substrate Current Modeling for Circuit Simulation · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1982
Integrated circuit design › analog and mixed-signal circuits
device modeling		 0.011982
Substrate Current Modeling for Circuit Simulation · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1982
Integrated circuit design › semiconductor devices › field-effect transistor
MOSFET		 0.011982
Substrate Current Modeling for Circuit Simulation · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1982

Methods — techniques the papers use, named apart from their topics

impact ionization modeling · 0.0
YearPublicationVenuePosition
1982 Substrate Current Modeling for Circuit Simulation
abstract
A new circuit simulation model is presented for impact ionization generated MOSFET substrate current. The model uses four parameters to accurately model substrate current over a wide range of device dimensions and operating voltages, including operation in the linear region. The model is able to model substrate currents from both heavily doped and lightly doped devices.
Jerry Mar, Sheau-Suey Li, Swei-Yam Yu
 IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.2