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VLDB 2026 Research / reviewers in the wild / expert

Ron G. Walther

dblp:93/4658 · DBLP profile ↗
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4ranked-venue papers
0as first author
0since 2021 · last 1997
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 4

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
2 papers
Electronic design automation · 100%

Topics — the 4 heaviest of 4, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation
hardware verification and test		 0.021994
Microprocessor Testing: Which Technique is Best? (Panel) · DAC 1994
Chip partitioning aid: A design technique for partitionability and testability in VLSI · DAC 1984
Electronic design automation › hardware verification and test › VLSI testing
microprocessor testing		 0.011994
Microprocessor Testing: Which Technique is Best? (Panel) · DAC 1994
Electronic design automation › hardware verification and test
design for testability		 0.011984
Chip partitioning aid: A design technique for partitionability and testability in VLSI · DAC 1984
Electronic design automation
physical design		 0.011984
Chip partitioning aid: A design technique for partitionability and testability in VLSI · DAC 1984
YearPublicationVenuePosition
1997 Microprocessor Test and Validation: Any New Avenues?
Magdy S. Abadir, Jacob A. Abraham, Hong Hao, C. Hunter, Wayne M. Needham, Ron G. Walther
 VTS6
1994 Microprocessor Testing: Which Technique is Best? (Panel)
abstract
No abstract available.
Jacob A. Abraham, Sandip Kundu, Janak H. Patel, Manuel A. d'Abreu, Bulent I. Dervisoglu, Marc E. Levitt, Hector R. Sucar, Ron G. Walther
 DAC8
1984 Chip partitioning aid: A design technique for partitionability and testability in VLSI
Subrata Dasgupta, M. C. Graf, Robert A. Rasmussen, Ron G. Walther, Thomas W. Williams
 DAC4
1982 A Variation of LSSD and Its Implications on Design and Test Pattern Generation in VLSI
Sumit DasGupta, Prabhakar Goel, Ron G. Walther, Thomas W. Williams
 ITC3