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Nelson M. Andrews

dblp:93/6754 · DBLP profile ↗
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1ranked-venue papers
0as first author
0since 2021 · last 1990
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Computer networks · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Software engineering, system software, and programming languages
1 paper
Software testing · 100%

Topics — the 3 heaviest of 3, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Software testing
software reliability
0.011990
Data Stability in an Application of a Software Reliability Model · IEEE J. Sel. Areas Commun. 1990
Software testing › software reliability › software reliability modeling
software reliability growth model
0.011990
Data Stability in an Application of a Software Reliability Model · IEEE J. Sel. Areas Commun. 1990
Software testing
system testing
0.011990
Data Stability in an Application of a Software Reliability Model · IEEE J. Sel. Areas Commun. 1990

Methods — techniques the papers use, named apart from their topics

parameter fitting · 0.0goel-okumoto model · 0.0
YearPublicationVenuePosition
1990 Data Stability in an Application of a Software Reliability Model
abstract
The Goel-Okumoto (1979) model of reliability growth is applied to the failure data for a large software development project. This is done by fitting the model parameters to the error counts and test times, which are periodically tabulated. In the early phases of system testing, the problem of inaccurate estimation due to insufficient reliability growth occurs. A simple test is devised to measure the stability of the data with respect to this problem. In practice, such a test on the data can be used to determine when system testing has sufficiently progressed to allow one to expect reasonable estimates from reliability growth models.>
George L. Gentzler Jr., Nelson M. Andrews
IEEE J. Sel. Areas Commun.2