Yuwei Zhang 0003

dblp:95/8351-3 · DBLP profile ↗
← Back
8ranked-venue papers
5as first author
6since 2021 · last 2026
—ORCID · conflict

Domains — the database's venue-derived domains; a paper can count in several

Software engineering, systems software and programming languages · 4 · 3 first-author · 3 since 2021Artificial intelligence and machine learning · 2 · 1 first-author · 1 since 2021Security and privacy · 1 · 1 since 2021Applied, interdisciplinary, general and emerging computing · 1 · 1 first-author · 1 since 2021
YearPublicationVenuePosition
2026 PATCH: Empowering Large Language Model with Programmer-Intent Guidance and Collaborative-Behavior Simulation for Automatic Bug Fixing
abstract
Bug fixing holds significant importance in software development and maintenance. Recent research has made substantial strides in exploring the potential of large language models (LLMs) for automatically resolving software bugs. However, a noticeable gap in existing approaches lies in the oversight of collaborative facets intrinsic to bug resolution, treating the process as a single-stage endeavor. Moreover, most approaches solely take the buggy code snippet as input for LLMs during the patch generation stage. To mitigate the aforementioned limitations, we introduce a novel stage-wise framework named PATCH. Specifically, we first augment the buggy code snippet with corresponding dependence context and intent information to better guide LLMs in generating the correct candidate patches. Additionally, by taking inspiration from bug management practices, we decompose the bug-fixing task into four distinct stages: bug reporting, bug diagnosis, patch generation, and patch verification. These stages are performed interactively by LLMs, aiming to simulate the collaborative behavior of programmers during the resolution of software bugs. By harnessing these collective contributions, PATCH effectively enhances the bug-fixing capability of LLMs. We implement PATCH by employing the powerful dialogue-based LLM ChatGPT. Our evaluation on the widely used bug-fixing benchmark BFP demonstrates that PATCH has achieved better performance than state-of-the-art LLMs.
Yuwei Zhang 0003, Zhi Jin 0001, Ge Li 0001, Fang Liu 0032, Wensheng Dou, Jun Wei 0001
ACM Trans. Softw. Eng. Methodol.1
2026 CITYWALK: Enhancing LLM-Based C++ Unit Test Generation via Project-Dependency Awareness and Language-Specific Knowledge
abstract
Unit testing plays a pivotal role in the software development lifecycle, as it ensures code quality. However, writing high-quality unit tests remains a time-consuming task for developers in practice. More recently, the application of large language models (LLMs) in automated unit test generation has demonstrated promising results. Existing approaches primarily focus on interpreted programming languages (e.g., Java), while mature solutions tailored to compiled programming languages like C++ are yet to be explored. The intricate language features of C++, such as pointers, templates, and virtual functions, pose particular challenges for LLMs in generating both executable and high-coverage unit tests. To tackle the aforementioned problems, this article introduces CITYWALK , a novel LLM-based framework for C++ unit test generation. CITYWALK enhances LLMs by providing a comprehensive understanding of the dependency relationships within the project under test via program analysis. Furthermore, CITYWALK incorporates language-specific knowledge about C++ derived from project documentation and empirical observations, significantly improving the correctness of the LLM-generated unit tests. We implement CITYWALK by employing the widely popular LLM GPT-4o. The experimental results show that CITYWALK outperforms current state-of-the-art approaches on a collection of ten popular C++ projects. Our findings demonstrate the effectiveness of CITYWALK in generating high-quality C++ unit tests.
Yuwei Zhang 0003, Qingyuan Lu, Wensheng Dou, Jun Wei 0001
ACM Trans. Softw. Eng. Methodol.1
2025 SAGA: Summarization-Guided Assert Statement Generation
Yuwei Zhang 0003, Zhi Jin 0001, Ze-Jun Wang, Ge Li 0001
J. Comput. Sci. Technol.1
2023 Vulnerability Name Prediction Based on Enhanced Multi-Source Domain Adaptation
abstract
Software products have brought convenience to modern society but also pose significant security risks due to various types of vulnerabilities. Identifying vulnerability names is vital for program repair and software maintenance, but the lack of training data presents a challenge. Big data analytics and machine learning can help overcome this challenge by processing large amounts of data and improving the accuracy of vulnerability name prediction. Considering that the data is often from datasets composed of multiple sources, a feature-based or attention-based multi-source domain adaptation (MSDA) approach is required. In this paper, we propose an MSDA method based on both feature and attention to accomplish the task of predicting vulnerability names, called Multi-Source Domain Adaptation for Vulnerability Name Prediction (MSDA-VNP). First, MSDA-VNP reduces domain divergence by adversarial training and then uses domain-invariant features to obtain feature correlations between individual source and target domains. In combination with the obtained domain correlations, Weighted multi-kernel Maximum Mean Discrepancy (WMK-MMD) is proposed as the attention mechanism. Second, a data augmentation strategy is employed to enhance MSDA-VNP to identify privacy-related vulnerabilities. To evaluate our approach, we conducted experiments on eight Java real-world projects in the Software Assurance Reference Dataset (SARD). The experimental results show that the proposed method MSDA-VNP performed efficiently and stably for the 44 types of vulnerabilities involved. The data augmentation strategy has also been proved to be effective as an enhancement for the proposed method MSDA-VNP.
Mengci Zhao, Bin Yang 0038, Yuwei Zhang 0003, Wenjin Li, Jiawei Gu, Lexi Xu
TrustCom4
2022 ST-TLF: Cross-version defect prediction framework based transfer learning
abstract
Cross-version defect prediction (CVDP) is a practical scenario in which defect prediction models are derived from defect data of historical versions to predict potential defects in the current version. Prior research employed defect data of the latest historical version as the training set using the empirical recommended method, ignoring the concept drift between versions, which undermines the accuracy of CVDP. We customized a Selected Training set and Transfer Learning Framework (ST-TLF) with two objectives: a) to obtain the best training set for the version at hand, proposing an approach to select the training set from the historical data; b) to eliminate the concept drift, designing a transfer strategy for CVDP. To evaluate the performance of ST-TLF, we investigated three research problems, covering the generalization of ST-TLF for multiple classifiers, the accuracy of our training set matching methods, and the performance of ST-TLF in CVDP compared against state-of-the-art approaches. The results reflect that (a) the eight classifiers we examined are all boosted under our ST-TLF, where SVM improves 49.74% considering MCC, as is similar to others; (b) when performing the best training set matching, the accuracy of the method proposed by us is 82.4%, while the experience recommended method is only 41.2%; (c) comparing the 12 control methods, our ST-TLF (with BayesNet), against the best contrast method P15-NB, improves the average MCC by 18.84%. Our framework ST-TLF with various classifiers can work well in CVDP. The training set selection method we proposed can effectively match the best training set for the current version, breaking through the limitation of relying on experience recommendation, which has been ignored in other studies. Also, ST-TLF can efficiently elevate the CVDP performance compared with random forest and 12 control methods.
Yanyang Zhao, Yuwei Zhang 0003, Dalin Zhang 0003, Yunzhan Gong, Dahai Jin
Inf. Softw. Technol.3
2022 Cross-project defect prediction based on G-LSTM model
Xiaomeng Qian, Yu Guan 0006, Bin Yang 0038, Yuwei Zhang 0003
Pattern Recognit. Lett.5
2020 Automated defect identification via path analysis-based features with transfer learning
abstract
Recently, artificial intelligence techniques have been widely applied to address various specialized tasks in software engineering, such as code generation, defect identification, and bug repair. Despite the diffuse usage of static analysis tools in automatically detecting potential software defects, developers consider the large number of reported alarms and the expensive cost of manual inspection to be a key barrier to using them in practice. To automate the process of defect identification, researchers utilize machine learning algorithms with a set of hand-engineered features to build classification models for identifying alarms as actionable or unactionable. However, traditional features often fail to represent the deep syntactic structure of alarms. To bridge the gap between programs’ syntactic structure and defect identification features, this paper first extracts a set of novel fine-grained features at variable-level, called path-variable characteristic, by applying path analysis techniques in the feature extraction process. We then raise a two-stage transfer learning approach based on our proposed features, called feature ranking-matching based transfer learning, to increase the performance of cross-project defect identification. Our experimental results for eight open-source projects show that the proposed features at variable-level are promising and can yield significant improvement on both within-project and cross-project defect identification.
Yuwei Zhang 0003, Dahai Jin, Yunzhan Gong
J. Syst. Softw.1
2020 A variable-level automated defect identification model based on machine learning
abstract
Static analysis tools, automatically detecting potential source code defects at an early phase during the software development process, are diffusely applied in safety-critical software fields. However, alarms reported by the tools need to be inspected manually by developers, which is inevitable and costly, whereas a large proportion of them are found to be false positives. Aiming at automatically classifying the reported alarms into true defects and false positives, we propose a defect identification model based on machine learning. We design a set of novel features at variable level, called variable characteristics, for building the classification model, which is more fine-grained than the existing traditional features. We select 13 base classifiers and two ensemble learning methods for model building based on our proposed approach, and the reported alarms classified as unactionable (false positives) are pruned for the purpose of mitigating the effort of manual inspection. In this paper, we firstly evaluate the approach on four open-source C projects, and the classification results show that the proposed model achieves high performance and reliability in practice. Then, we conduct a baseline experiment to evaluate the effectiveness of our proposed model in contrast to traditional features, indicating that features at variable level improve the performance significantly in defect identification. Additionally, we use machine learning techniques to rank the variable characteristics in order to identify the contribution of each feature to our proposed model.
Yuwei Zhang 0003, Yunzhan Gong, Dahai Jin
Soft Comput.1